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M74HC590 Ver la hoja de datos (PDF) - STMicroelectronics

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M74HC590 Datasheet PDF : 15 Pages
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M74HC590
Test Condition
Symbol
Parameter
VCC CL
(V) (pF)
tREM Minimum Removal 2.0
Time (CCLR)
4.5 50
6.0
Value
TA = 25°C
-40 to 85°C -55 to 125°C Unit
Min. Typ. Max. Min. Max. Min. Max.
28 75
95
110
7 15
19
22 ns
6 13
16
19
CAPACITIVE CHARACTERISTICS
Test Condition
Value
Symbol
Parameter
VCC
(V)
TA = 25°C
-40 to 85°C -55 to 125°C Unit
Min. Typ. Max. Min. Max. Min. Max.
CIN Input Capacitance
5 10
10
10 pF
CPD Power Dissipation
Capacitance (note
40
pF
1)
1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without
load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. ICC(opr) = CPD x VCC x fIN + ICC
TEST CIRCUIT
TEST
tPLH, tPHL
tPZL, tPLZ
tPZH, tPHZ
CL = 50pF/150pF or equivalent (includes jig and probe capacitance)
R1 = 1Kor equivalent
RT = ZOUT of pulse generator (typically 50)
8/15
SWITCH
Open
VCC
GND

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