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HI5735(1998) Ver la hoja de datos (PDF) - Intersil

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HI5735 Datasheet PDF : 12 Pages
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HI5735
Electrical Specifications TAAVE=E2,5DoVCEfEor=A-l4l .T9y4pitcoa-l5V.a4l6uVe,sVC(CCo=n+ti4n.7u5edto) +5.25V, VREF = Internal
PARAMETER
TEST CONDITIONS
HI5735BI
TA = 0oC TO 70oC
MIN TYP MAX
UNITS
Spurious Free Dynamic Range to Nyquist
(Note 3)
REFERENCE/CONTROL AMPLIFIER
fCLK = 40MHz, fOUT = 2.02MHz, 20MHz Span
fCLK = 80MHz, fOUT = 2.02MHz, 40MHz Span
-
70
-
dBc
-
70
-
dBc
Internal Reference Voltage, VREF
Internal Reference Voltage Drift
(Note 4)
(Note 3)
-1.27
-
-1.23
50
-1.17
-
V
µV/oC
Internal Reference Output Current Sink/Source (Note 3)
Capability
-125
-
+50
µA
Internal Reference Load Regulation
Input Impedance at REF OUT pin
IREF = 0 to IREF = -125µA
(Note 3)
-
50
-
µV
-
1.4
-
k
Amplifier Large Signal Bandwidth (0.6VP-P)
Sine Wave Input, to Slew Rate Limited (Note 3)
-
3
-
MHz
Amplifier Small Signal Bandwidth (0.1VP-P)
Sine Wave Input, to -3dB Loss (Note 3)
-
10
-
MHz
Reference Input Impedance
(Note 3)
-
12
-
k
Reference Input Multiplying Bandwidth (CTL IN)
DIGITAL INPUTS (D9-D0, CLK, INVERT)
RL = 50, 100mV Sine Wave, to -3dB Loss at
IOUT (Note 3)
-
200
-
MHz
Input Logic High Voltage, VIH
Input Logic Low Voltage, VIL
Input Logic Current, IIH
Input Logic Current, IIL
Digital Input Capacitance, CIN
TIMING CHARACTERISTICS
(Note 4)
(Note 4)
(Note 4)
(Note 4)
(Note 3)
2.0
-
-
V
-
-
0.8
V
-
-
400
µA
-
-
700
µA
-
3.0
-
pF
Data Setup Time, tSU
Data Hold Time, tHLD
Propagation Delay Time, tPD
CLK Pulse Width, tPW1, tPW2
POWER SUPPLY CHARACTERISITICS
See Figure 1 (Note 3)
See Figure 1 (Note 3)
See Figure 1 (Note 3)
See Figure 1 (Note 3)
3.0 2.0
-
ns
0.5 0.25
-
ns
-
4.5
-
ns
3.0
-
-
ns
IEEA
IEED
ICCD
Power Dissipation
(Note 4)
(Note 4)
(Note 4)
(Note 4)
-
42
50
mA
-
70
85
mA
-
13
20
mA
-
650
-
mW
Power Supply Rejection Ratio
VCC ±5%, VEE ±5%
-
5
-
µA/V
NOTES:
2. Gain Error measured as the error in the ratio between the full scale output current and the current through RSET (typically 1.28mA). Ideally
the ratio should be 16.
3. Parameter guaranteed by design or characterization and not production tested.
4. All devices are 100% tested at 25oC. 100% production tested at temperature extremes for military temperature devices, sample tested
for industrial temperature devices.
5. Dynamic Range must be limited to a 1V swing within the compliance range.
1624

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