N74F175D Ver la hoja de datos (PDF) - Philips Electronics
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N74F175D Datasheet PDF : 10 Pages
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Philips Semiconductors
Quad D flip-flop
Product specification
74F175A
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
VCC
VIH
VIL
IIK
IOH
IOL
Tamb
Supply voltage
High-level input voltage
Low-level input voltage
Input clamp current
High-level output current
Low-level output current
Operating free air temperature range
Commercial range
Industrial range
LIMITS
UNIT
MIN
NOM
MAX
4.5
5.0
5.5
V
2.0
V
0.8
V
–18
mA
–1
mA
20
mA
0
+70
°C
–40
+85
°C
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST
LIMITS
UNIT
CONDITIONS1
MIN TYP2 MAX
VOH
High-level output voltage
VCC= MIN, VIL = MAX,
VIH = MIN, IOH = MAX
"10%VCC
"5%VCC
2.5
2.7
3.4
V
VOL
Low-level output voltage
VCC = MIN, VIL = MAX,
VIH = MIN, IOL = MAX
"10%VCC
"5%VCC
0.30 0.5
V
0.30 0.5
VIK
Input clamp voltage
VCC = MIN, II = IIK
–0.73 –1.2
V
II
Input current at maximum input voltage
VCC = 0.0V, VI = 7.0V
100 µA
IIH
High-level input current
VCC = MAX, VI = 2.7V
20
µA
IIL
Low-level input current
IOS
Short-circuit output current3
VCC = MAX, VI = 0.5V
74F175A
VCC = MAX
–60
–20 µA
–150 mA
ICC
Supply current (total)
VCC = MAX
74F175A
22
31
mA
Notes to DC electrical characteristics
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
AC ELECTRICAL CHARACTERISTICS FOR 74F175A
SYMBOL
PARAMETER
fmax
Maximum clock
frequency
tPLH
Propagation delay
tPHL
CP to Qn or Qn
tPLH
Propagation delay
tPHL
MR to Qn
tPHL
Propagation delay
tPHL
MR to Qn
TEST
CONDITION
Waveform 1
Waveform 1
Waveform 3
Tamb = 25°C
VCC = +5V
CL = 50pF,
RL = 500Ω
MIN TYP MAX
140 160
3.0
4.0
6.5
4.5
6.0
8.5
4.5
6.5
9.0
Waveform 3 4.5
6.0
8.0
LIMITS
Tamb = 0°C to +70°C
VCC = +5.0V ± 10%
CL = 50pF,
RL = 500Ω
MIN
MAX
Tamb = *40°C to +85°C
VCC = +5.0V ± 10%
CL = 50pF,
RL = 500Ω
MIN
MAX
UNIT
125
110
MHz
2.5
7.5
4.0
9.0
2.5
4.0
8.0
10.0
ns
4.5
10.0
4.5
11.0
ns
4.0
9.0
4.0
10.0
ns
1996 Mar 12
4
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