P93U422-35CM Ver la hoja de datos (PDF) - Semiconductor Corporation

Número de pieza

componentes Descripción

Lista de partido

P93U422-35CM

HIGH SPEED 256 x 4 STATIC CMOS RAM

Semiconductor Corporation 

P93U422

Notes:

5) Test conditions assume signal transition times of 10 ns or less.

6) Extended temperature operation guaranteed with 400 linear feet per minute of air flow.

7)

t (A)

PLH

and

t (A)

PHL

are

tested

with

S1

closed

and

CL

=

15

pF

with

both

input

and

output

timing

referenced

to

1.5V

8) tPZH(WE), tPZH(CS1, CS2) and tPZH(OE) are measured with S1 open, CL = 15 pF and with both the input and output timing

referenced to 1.5V. tPZL(WE), tPZL(CS1, CS2) and tPZL(OE) are measured with S1 closed, CL = 15pF and with both the input and

output timing referenced to 1.5V.

tPHZ(WE), tPHZ(CS1, CS2) and tPHZ(OE) are measured with S1 open, CL < 5pF and are measured between the 1.5V level

input to the VOH -500mV level on the output.

tPLZ(WE), tPLZ(CS1, CS2) and tPLZ(OE) are measured with S1 closed, CL < 5pF and are measured between the 1.5V level

input to the VOL +500mV level on the output.

on the

on the

SWITCHING TEST

Test Circuits (7, 8)

Document # SRAM102 REV A

Page 4 of 10

Share Link: