N4850A Ver la hoja de datos (PDF) - HP => Agilent Technologies
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N4850A Datasheet PDF : 20 Pages
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Ordering Information
When you configure your
DigRF v3 measurement
system,consider the following:
1. Ability to provide DigRF v3
stimulus: For comprehensive
stimulus and response testing
of your DigRF v3 device or
system, select a logic analyzer
with digital pattern generation
capability (16822A, 16823A, or
a 16900 modular logic analysis
system with a 16720A pattern
generator module).
2. Flexibility to grow as your
measurement needs evolve: A
modular 16900 Series logic
analyzer addresses your
measurement needs today and
allows you to grow as your
needs evolve.
3. Modification of the logic analyzer’s
DigRF v3 protocol decoder: The
DigRF v3 standard provides
the flexibility to customize
your control structure and
data packets for your specific
application. With the B4641A
protocol development kit, you
can modify the logic analyer’s
DigRF v3 protocol decoder to
track your custom solution.
Target design and test equipment
requirements for DigRF v3 digital
acquisition and stimulus
measurements
In addition to compatible
measurement equipment, the
device under test (DUT) requires
the following to ensure proper
acquisition and stimulus of
the DUT.
DUT requirements for the N4850A
acquisition probe:
• Access to SysClk to determine
when data is valid on the
serial bus
• Probing connection for the
acquisition probe, preferably
at the receiver. Please refer to
the N4850A User Guide and
the Agilent N4850A Design
Guide (N4850-97002) for
information on designing a
connection with good signal
integrity.
DUT requirements for use with
N4860A stimulus probe:
• SMA (m-m) connectors on the
target. The number of SMA
connectors depends on your
test scenario: BB-IC turn on,
RF-IC validation, or system
integration
• Place a 50-ohm termination
resistor between the positive
and negative differential pair
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