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N74F842D
(Rev.:2004)

10-bit bus interface latches, non-inverting/inverting (3-State)

Philips Electronics 

Philips Semiconductors

10-bit bus interface latches, non-inverting/inverting

(3-State)

Product data

74F841/74F842

DC ELECTRICAL CHARACTERISTICS

Over recommended operating free-air temperature range unless otherwise noted.

SYMBOL

PARAMETER

TEST CONDITIONS1

LIMITS

MIN TYP2 MAX

UNIT

VOH

HIGH-level output voltage

VOL

LOW-level output voltage

± 10%VCC 2.2

–

–

V

VCC = MIN;

IOH = –15 mA ± 5%VCC

2.2

3.3

–

V

VIL = MAX;

VIH = MIN

± 10%VCC 2.0

–

–

V

IOH = –24 mA

± 5%VCC

2.0

–

–

V

VCC = MIN; IOL = 32 mA ± 10%VCC

–

0.38 0.55

V

VIL = MAX;

VIH = MIN

IOL = 48 mA ± 5%VCC

–

0.38 0.55

V

VIK

II

IIH

IIL

IOZH

Input clamp voltage

Input current at maximum input voltage

HIGH-level input current

LOW-level input current

Off-state output current,

HIGH-level voltage applied

VCC = MIN; II = IIK

VCC = 0 V; VI = 7.0 V

VCC = MAX; VI = 2.7 V

VCC = MAX; VI = 0.5 V

VCC = MAX; VO = 2.7 V

–

–0.73 –1.2

V

–

–

100

µA

–

–

20

µA

–

–

–20

µA

–

–

50

µA

IOZL

Off-state output current,

LOW-level voltage applied

VCC = MAX; VO = 0.5 V

–

–

–50

µA

IOS

Short-circuit output current3

VCC = MAX

–100

–

–225

mA

ICCH

–

50

65

mA

74F841 ICCL

VCC = MAX

–

60

80

mA

ICC

Supply current

(total)

ICCZ

ICCH

–

70

92

mA

–

40

60

mA

74F842 ICCL

VCC = MAX

–

65

90

mA

ICCZ

–

60

90

mA

NOTES:

1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.

2. All typical values are at VCC = 5 V, Tamb = 25 °C.

3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold

techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged

shorting of a HIGH output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests.

In any sequence of parameter test, IOS tests should be performed last.

2004 Jan 23

6

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