![](/html/ON-Semiconductor/247360/page5.png)
74HC86
tr
INPUT
A OR B
90%
50%
10%
tPLH
OUTPUT Y
90%
50%
10%
tTLH
tf
VCC
GND
tPHL
tTHL
Figure 1. Switching Waveforms
DEVICE
UNDER
TEST
TEST POINT
OUTPUT
CL*
*Includes all probe and jig capacitance
Figure 2. Test Circuit
A
Y
B
Figure 3. Expanded Logic Diagram
(1/4 of Device)
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