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74LV368N

Hex buffer/line driver; inverting (3-State)

Philips Electronics 

Philips Semiconductors

Hex buffer/line driver; inverting (3-State)

Product specification

74LV368

FUNCTIONAL DIAGRAM

2

1A

4

2A

6

3A

10 4A

1

1OE

12 5A

14 6A

15 2OE

1Y 3

2Y 5

3Y 7

4Y 9

5Y 11

6Y 13

FUNCTION TABLE

INPUTS

nOE

nA

L

L

L

H

H

X

NOTES:

H = HIGH voltage level

L = LOW voltage level

X = Don’t care

Z = High impedance OFF-state

OUTPUT

nY

H

L

Z

SV00376

RECOMMENDED OPERATING CONDITIONS

SYMBOL

VCC

VI

VO

Tamb

PARAMETER

DC supply voltage

Input voltage

Output voltage

Operating ambient temperature range

in free air

CONDITIONS

See Note1

See DC and AC

characteristics

MIN

TYP.

MAX

UNIT

1.0

3.3

3.6

V

0

–

VCC

V

0

–

VCC

V

–40

–40

+85

+125

°C

tr, tf

Input rise and fall times

VCC = 1.0V to 2.0V

–

VCC = 2.0V to 2.7V

–

VCC = 2.7V to 3.6V

–

–

500

–

200

ns/V

–

100

NOTES:

1 The LV is guaranteed to function down to VCC = 1.0V (input levels GND or VCC); DC characteristics are guaranteed from VCC = 1.2V to VCC = 3.6V.

ABSOLUTE MAXIMUM RATINGS1, 2

In accordance with the Absolute Maximum Rating System (IEC 134); Voltages are referenced to GND (ground = 0V)

SYMBOL

PARAMETER

CONDITIONS

RATING

VCC

±IIK

±IOK

±IO

DC supply voltage

DC input diode current

DC output diode current

DC output source or sink current

– bus driver outputs

VI < –0.5 or VI > VCC + 0.5V

VO < –0.5 or VO > VCC + 0.5V

–0.5V < VO < VCC + 0.5V

–0.5 to +4.6

20

50

35

UNIT

V

mA

mA

mA

±IGND,

±ICC

DC VCC or GND current for types with

–bus driver outputs

70

mA

Tstg

Storage temperature range

–65 to +150

°C

Power dissipation per package

for temperature range: –40 to +125°C

PTOT

–plastic DIL

–plastic mini-pack (SO)

above +70°C derate linearly with 12mW/K

above +70°C derate linearly with 8 mW/K

750

500

mW

–plastic shrink mini-pack (SSOP and TSSOP) above +60°C derate linearly with 5.5 mW/K

400

NOTES:

1 Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the

device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to

absolute-maximum-rated conditions for extended periods may affect device reliability.

2 The input and output voltage ratings may be exceeded if the input and output current ratings are observed.

1998 May 29

4

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