74LVX32 Ver la hoja de datos (PDF) - STMicroelectronics
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74LVX32 Datasheet PDF : 11 Pages
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74LVX32
Table 6: DC Specifications
Test Condition
Value
Symbol
Parameter
VCC
(V)
TA = 25°C
-40 to 85°C -55 to 125°C Unit
Min. Typ. Max. Min. Max. Min. Max.
VIH High Level Input
2.0
Voltage
3.0
1.5
1.5
1.5
2.0
2.0
2.0
V
3.6
2.4
2.4
2.4
VIL Low Level Input
2.0
Voltage
3.0
0.5
0.5
0.5
0.8
0.8
0.8 V
3.6
0.8
0.8
0.8
VOH High Level Output 2.0
IO=-50 µA
1.9 2.0
1.9
1.9
Voltage
3.0
IO=-50 µA
2.9 3.0
2.9
2.9
V
3.0
IO=-4 mA
2.58
2.48
2.4
VOL Low Level Output 2.0
Voltage
3.0
IO=50 µA
IO=50 µA
0.0 0.1
0.1
0.1
0.0 0.1
0.1
0.1 V
3.0
IO=4 mA
0.36
0.44
0.55
II
Input Leakage
Current
3.6 VI = 5V or GND
± 0.1
±1
± 1 µA
ICC
Quiescent Supply
Current
3.6 VI = VCC or GND
2
20
20 µA
Table 7: Dynamic Switching Characteristics
Test Condition
Value
Symbol
Parameter
VCC
(V)
VOLP Dynamic Low
Voltage Quiet
3.3
VOLV Output (note 1, 2)
VIHD Dynamic High
3.3
Voltage Input (note
1, 3)
VILD Dynamic Low
3.3
Voltage Input (note
1, 3)
CL = 50 pF
TA = 25°C
-40 to 85°C -55 to 125°C Unit
Min. Typ. Max. Min. Max. Min. Max.
0.3 0.5
-0.5 -0.3
2
V
0.8
1) Worst case package.
2) Max number of outputs defined as (n). Data inputs are driven 0V to 3.3V, (n-1) outputs switching and one output at GND.
3) Max number of data inputs (n) switching. (n-1) switching 0V to 3.3V. Inputs under test switching: 3.3V to threshold (VILD), 0V to threshold
(VIHD), f=1MHz.
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