Test Conditions
Table 6. Test Specifications
Test Condition
Output Load
Output Load Capacitance, CL(including jig capacitance)
Input Rise and Fall Times
Input Pulse Levels
Input timing measurement reference levels
Output timing measurement reference levels
-55
30
5
0.0 - 3.0
1.5
1.5
A29040 Series
All others
Unit
1 TTL gate
100
pF
20
ns
0.45 - 2.4
V
0.8, 2.0
V
0.8, 2.0
V
Device
Under
Test
5.0 V
2.7 KΩ
CL
6.2 KΩ
Diodes = IN3064 or Equivalent
Figure 7. Test Setup
PRELIMINARY (August, 2001, Version 0.5)
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AMIC Technology, Inc.