APW704510NC-TU Ver la hoja de datos (PDF) - Anpec Electronics
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APW704510NC-TU Datasheet PDF : 12 Pages
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APW7045
Reliability test program
Test item
SOLDERABILITY
HOLT
PCT
TST
ESD
Latch-Up
Method
MIL-STD-883D-2003
MIL-STD-883D-1005.7
JESD-22-B, A102
MIL-STD-883D-1011.9
MIL-STD-883D-3015.7
JESD 78
Description
245°C , 5 SEC
1000 Hrs Bias @ 125 °C
168 Hrs, 100 % RH , 121°C
-65°C ~ 150°C, 200 Cycles
VHBM > 2KV, VMM > 200V
10ms , Itr > 100mA
Carrier Tape & Reel Dimensions
t
Po
P
D
E
P1
F
Bo
W
Ko
Ao
D1
T2
J
C
A
B
T1
Application
A
SOP- 16
(150mil)
330 ± 3
F
7.5 ± 0.1
B
100 + 2
D
C
13 + 0.5
D1
J
2 ± 0.5
Po
T1
T2
16.4 + 0.3
- 0.2
2.5 ± 0.5
P1
Ao
W
16 ± 0.3
Bo
P
E
8.0 ± 0.1 1.75 ± 0.1
Ko
t
1.5 + 0.1 1.5 + 0.25 4.0 ± 0.1 2.0 ± 0.1 6.5 ± 0.1 10.3 ± 0. 1 2.1 ± 0.1 0.3 ± 0.05
Application
A
B
D0
D1
E
F
P0
P1
P2
SSOP-16
6.95
T
5.4 1.55±0.05 1.55±0.1 1.75±0.1 5.5±0.05 4.0±0.1 8.0±0.1 2.0±0.05
T2
W
W1
C1
C2
T1
T2
C
0.3±0.05
2.2
12.0±0.3
9.5
13±0.3 21±0.8 13.5±0.5 2.0±0.2 80±1
Copyright ANPEC Electronics Corp.
11
Rev.A.5 - Jan., 2003
(mm)
www.anpec.com.tw
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