CY7C265-50DMB Ver la hoja de datos (PDF) - Cypress Semiconductor

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Lista de partido

CY7C265-50DMB

8K x 8 Registered PROM

Cypress Semiconductor 

CY7C265

Electrical Characteristics Over the Operating Range[2]

7C265-15, 25 7C265-40 7C265-50

Parameter

Description

Test Conditions

Min. Max. Min. Max. Min. Max. Unit

VOH

VOL

VIH

VIL

IIX

IOZ

IOS[3]

ICC

Output HIGH Voltage

Output LOW Voltage

Input HIGH Voltage

VCC = Min., IOH = –2.0 mA

2.4

VCC = Min., IOH = –4.0 mA

VCC = Min., IOL = 8.0 mA Com’l

VCC = Min., IOL = 12.0 mA

VCC = Min., IOL = 6.0 mA Mil

VCC = Min., IOL = 8.0 mA

2.0

Input LOW Voltage

Input Load Current

GND < VIN < VCC

–10

Output Leakage Current

GND < VOUT < VCC,

–40

Output Disabled

Output Short Circuit Current

VCC Operating Supply

Current

VCC = Max., VOUT = GND

VCC = Max., IOUT = 0 mA Com’l

Mil

V

2.4

2.4

0.4

V

0.4

0.4

0.4

0.4

2.0

2.0

V

0.8

0.8

0.8 V

+10 –10 +10 –10 +10 µA

+40 –40 +40 –40 +40 µA

90

90

90 mA

120

100

mA

120

VPP

IPP

VIHP

Programming Supply Voltage

Programming Supply Current

Input HIGH Programming

Voltage

12 13 12 13 12 13 V

50

50

50 mA

3.0

3.0

3.0

V

VILP

Input LOW Programming

Voltage

0.4

0.4

0.4 V

Capacitance[4]

Parameter

Description

Test Conditions

Max.

CIN

COUT

Input Capacitance

TA = 25°C, f = 1 MHz,

10

Output Capacitance

VCC = 5.0V

10

Notes:

2. See the last page of this specification for Group A subgroup testing information.

3. For test purposes, not more than one output at a time should be shorted. Short circuit test duration should not exceed 30 seconds.

4. See Introduction to CMOS PROMs in this Data Book for general information on testing.

Unit

pF

pF

Document #: 38-04012 Rev. *A

Page 3 of 11

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