DS2172TN Ver la hoja de datos (PDF) - Dallas Semiconductor -> Maxim Integrated

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DS2172TN

Bit Error Rate Tester (BERT)

Dallas Semiconductor -> Maxim Integrated 

DS2172 FUNCTIONAL BLOCK DIAGRAM Figure 1

DS2172

DS2172 PATTERN GENERATION BLOCK DIAGRAM Figure 2

NOTES:

1. Tap A always equals length (N-1) of pseudorandom or repetitive pattern.

2. Tab B can be programmed to any feedback tap for pseudorandom pattern generation.

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