HEF4027B(2008) Ver la hoja de datos (PDF) - NXP Semiconductors.

Número de pieza

componentes Descripción

Lista de partido

HEF4027B
(Rev.:2008)

Dual JK flip-flop

NXP Semiconductors. 

NXP Semiconductors

HEF4027B

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14. Abbreviations

Table 11. Abbreviations

Acronym

Description

DUT

Device Under Test

ESD

ElectroStatic Discharge

HBM

Human Body Model

MM

Machine Model

15. Revision history

Table 12. Revision history

Document ID

Release date Data sheet status

Change notice Supersedes

HEF4027B_5

Modifications:

HEF4027B_4

20081110

Product data sheet

-

HEF4027B_4

• Maximum Tamb changed to 85 °C and Tamb = 125 °C parameter data removed throughout.

• Section 1 “General description” temperature range statement modified.

• Section 10 “Static characteristics” IDD, IOL, IOH and II values revised.

20080703

Product specification

-

HEF4027B_CNV_3

HEF4027B_CNV_3

19950101

Product specification

-

HEF4027B_CNV_2

HEF4027B_CNV_2

19950101

Product specification

-

-

HEF4027B_5

Product data sheet

Rev. 05 — 10 November 2008

© NXP B.V. 2008. All rights reserved.

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