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IDT54FCT377ATSOB Ver la hoja de datos (PDF) - Integrated Device Technology

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IDT54FCT377ATSOB
IDT
Integrated Device Technology IDT
IDT54FCT377ATSOB Datasheet PDF : 7 Pages
1 2 3 4 5 6 7
IDT54/74FCT377T/AT/CT/DT
FAST CMOS OCTAL D FLIP-FLOP WITH CLOCK ENABLE
MILITARY AND COMMERCIAL TEMPERATURE RANGES
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Commercial: TA = 0°C to +70°C, VCC = 5.0V ± 5%; Military: TA = –55°C to +125°C, VCC = 5.0V ± 10%
Symbol
Parameter
Test Conditions(1)
Min. Typ.(2)
Max.
VIH
Input HIGH Level
Guaranteed Logic HIGH Level
2.0
VIL
Input LOW Level
Guaranteed Logic LOW Level
IIH
Input HIGH Current(4)
VCC = Max.
VI = 2.7V
IIL
Input LOW Current(4)
VCC = Max.
VI = 0.5V
II
Input HIGH Current(4)
VCC = Max., VI = VCC (Max.)
0.8
±1
±1
±1
VIK
Clamp Diode Voltage
VCC = Min., IN = –18mA
IOS
Short Circuit Current
VCC = Max.(3), VO = GND
–0.7
–1.2
–60 –120 –225
VOH
Output HIGH Voltage
VCC = Min.
IOH = –6mA MIL.
2.4
3.3
VIN = VIH or VIL
IOH = –8mA COM’L.
IOH = –12mA MIL.
2.0
3.0
IOH = –15mA COM’L.
VOL
Output LOW Voltage
VCC = Min.
IOL = 32mA MIL.
0.3
0.5
VIN = VIH or VIL
IOL = 48mA COM’L.
IOFF
Input/Output Power Off
VCC = 0V, VIN or VO 4.5V
Leakage(5)
±1
VH
Input Hysteresis
200
ICC
Quiescent Power
VCC = Max.
0.01
1
Supply Current
VIN = GND or VCC
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient.
3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second.
4. The test limit for this parameter is ±5µA at TA = -55°C.
5. This parameter is guaranted but not tested.
Unit
V
V
µA
µA
µA
V
mA
V
V
V
µA
mV
mA
2630 tbl 05
6.14
3

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