IDT54FCT3827Q Ver la hoja de datos (PDF) - Integrated Device Technology
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IDT54FCT3827Q Datasheet PDF : 7 Pages
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IDT54/74FCT3827A/B
3.3V CMOS OCTAL BUFFERS
MILITARY AND COMMERCIAL TEMPERATURE RANGES
PIN CONFIGURATIONS
OE1
D0
D1
D2
D3
D4
D5
D6
D7
D8
D9
GND
1
24
2
23
3
22
4 P24-1 21
5 D24-1 20
6 SO24-2 19
7 SO24-7 18
8 & 17
9 SO24-8 16
10
15
11
14
12
13
VCC
Y0
Y1
Y2
Y3
Y4
Y5
Y6
Y7
Y8
Y9
OE2
DIP/SOIC/SSOP/QSOP
TOP VIEW
3092 drw 02
ABSOLUTE MAXIMUM RATINGS(1)
Symbol
Rating
VTERM(2) Terminal Voltage
with Respect to
GND
VTERM(3) Terminal Voltage
with Respect to
GND
VTERM(4) Terminal Voltage
with Respect to
GND
TA
Operating
Temperature
TBIAS Temperature
Under Bias
TSTG Storage
Temperature
PT
Power Dissipation
Commercial
–0.5 to +4.6
–0.5 to +7.0
–0.5 to
VCC + 0.5
–40 to +85
–55 to +125
–55 to +125
1.0
Military
–0.5 to +4.6
–0.5 to +7.0
–0.5 to
VCC + 0.5
–55 to +125
–65 to +135
–65 to +150
1.0
Unit
V
V
V
°C
°C
°C
W
IOUT
DC Output
–60 to +60 –60 to +60 mA
Current
NOTES:
3092 lnk 03
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RAT-
INGS may cause permanent damage to the device. This is a stress rating
only and functional operation of the device at these or any other conditions
above those indicated in the operational sections of this specification is
not implied. Exposure to absolute maximum rating conditions for ex-
tended periods may affect reliability.
2. Vcc terminals.
3. Input terminals.
4. Output and I/O terminals.
PIN DESCRIPTION
Names
OEI
DI
I/O
Description
I
When both are LOW the outputs are
enabled. When either one or both are
HIGH the outputs are High Z.
I
10-bit data input.
YI
O 10-bit data output.
3092 tbl 01
FUNCTION TABLE(1)
Inputs
Output
OE1 OE2
DI
YI
L
L
L
L
L
L
H
H
H
X
X
Z
X
H
X
Z
NOTE:
1. H = HIGH Voltage Level
X = Don’t Care
L = LOW Voltage Level
Z = High Impedance
Function
Transparent
Three-State
3092 tbl 02
CAPACITANCE (TA = +25°C, f = 1.0MHz)
Symbol Parameter(1)
CIN
Input
Capacitance
Conditions Typ. Max. Unit
VIN = 0V
3.5 6.0 pF
COUT Output
VOUT = 0V 4.0 8.0 pF
Capacitance
NOTE:
3092 lnk 04
1. This parameter is measured at characterization but not tested.
8.15
2
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