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IDT7025

HIGH-SPEED 16K x 16 DUAL-PORT STATIC RAM

Integrated Device Technology 

IDT7025S/L

HIGH-SPEED 8K x 16 DUAL-PORT STATIC RAM

MILITARY AND COMMERCIAL TEMPERATURE RANGES

AC TEST CONDITIONS

Input Pulse Levels

Input Rise/Fall Times

Input Timing Reference Levels

Output Reference Levels

Output Load

GND to 3.0V

5ns Max.

1.5V

1.5V

Figures 1 and 2

2683 tbl 12

DATAOUT

BUSY

INT

775Ω

5V

1250Ω

30pF

DATAOUT

775Ω

5V

1250Ω

5pF

2683 drw 06

Figure 1. AC Output Test Load

Figure 2. Output Test Load

( for tLZ, tHZ, tWZ, tOW)

* including scope and jig.

AC ELECTRICAL CHARACTERISTICS OVER THE

OPERATING TEMPERATURE AND SUPPLY VOLTAGE RANGE(4)

Symbol

Parameter

IDT7025X15

Com'l. Only

Min. Max.

IDT7025X17

Com'l. Only

Min. Max.

READ CYCLE

tRC

Read Cycle Time

15 —

17

—

tAA

Address Access Time

tACE

Chip Enable Access Time(3)

tABE

Byte Enable Access Time(3)

— 15

—

17

— 15

—

17

— 15

—

17

tAOE

Output Enable Access Time

— 10

—

10

tOH

Output Hold from Address Change

3

—

3

—

tLZ

Output Low-Z Time(1, 2)

3

—

3

—

tHZ

Output High-Z Time(1, 2)

— 10

—

10

tPU

Chip Enable to Power Up Time(1,2)

0

—

0

—

tPD

Chip Disable to Power Down Time(1,2)

— 15

—

17

tSOP

tSAA

Semaphore Flag Update Pulse (OE or SEM) 10

—

10

—

Semaphore Address Access(3)

— 15

—

17

IDT7025X20

Min. Max.

20

—

—

20

—

20

—

20

—

12

3

—

3

—

—

12

0

—

—

20

10

—

—

20

IDT7025X25

Min. Max. Unit

25

— ns

—

25 ns

—

25 ns

—

25 ns

—

13 ns

3

— ns

3

— ns

—

15 ns

0

— ns

—

25 ns

10

— ns

—

25 ns

Symbol

Parameter

READ CYCLE

tRC

Read Cycle Time

tAA

Address Access Time

tACE

Chip Enable Access Time(3)

tABE

Byte Enable Access Time(3)

tAOE

Output Enable Access Time

tOH

Output Hold from Address Change

tLZ

Output Low-Z Time(1, 2)

tHZ

Output High-Z Time(1, 2)

tPU

Chip Enable to Power Up Time(1,2)

tPD

Chip Disable to Power Down Time(1,2)

tSOP

tSAA

Semaphore Flag Update Pulse (OE or SEM)

Semaphore Address Access Time(3)

IDT7025X35

Min. Max.

IDT7025X55

Min. Max.

IDT7025X70

Mil. Only

Min. Max. Unit

35

—

55

—

70

— ns

—

35

—

55

—

70 ns

—

35

—

55

—

70 ns

—

35

—

55

—

70 ns

—

20

—

30

—

35 ns

3

—

3

—

3

— ns

3

—

3

—

3

— ns

—

15

—

25

—

30 ns

0

—

0

—

0

— ns

—

35

—

50

—

50 ns

15

—

15

—

15

— ns

—

35

—

55

—

70 ns

NOTES:

1. Transition is measured ±500mV from Low or High-impedance voltage with Output Test Load (Figure 2).

2. This parameter is guaranteed by device characterization, but is not production tested.

3. To access RAM, CE = VIL, UB or LB = VIL, and SEM = VIH. To access semephore, CE = VIH or UB & LB = VIH, and SEM = VIL.

4. "X" in part numbers indicates power rating (S or L).

2683 tbl 13

6.16

7

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