IDT74FCT827ATEB Ver la hoja de datos (PDF) - Integrated Device Technology
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IDT74FCT827ATEB Datasheet PDF : 7 Pages
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IDT54/74FCT827AT/BT/CT/DT, IDT54/74FCT2827AT/BT/CT
HIGH-PERFORMANCE CMOS BUFFERS
MILITARY AND COMMERCIAL TEMPERATURE RANGES
TEST CIRCUITS AND WAVEFORMS
TEST CIRCUITS FOR ALL OUTPUTS
V CC
VIN
Pulse
Generator
D.U.T.
RT
VOUT
50pF
CL
500Ω
500Ω
7.0V
SWITCH POSITION
Test
Switch
Open Drain
Disable Low
Closed
Enable Low
All Other Tests
Open
DEFINITIONS:
2573 lnk 11
CL= Load capacitance: includes jig and probe capacitance.
RT = Termination resistance: should be equal to ZOUT of the Pulse
Generator.
2573 drw 04
SET-UP, HOLD AND RELEASE TIMES
PULSE WIDTH
DATA
INPUT
tSU
TIMING
INPUT
ASYNCHRONOUS CONTROL
PRESET
CLEAR
ETC.
SYNCHRONOUS CONTROL
PRESET
CLEAR
CLOCK ENABLE
tSU
ETC.
tH
tREM
tH
PROPAGATION DELAY
SAME PHASE
INPUT TRANSITION
tPLH
tPHL
OUTPUT
tPLH
tPHL
OPPOSITE PHASE
INPUT TRANSITION
3V
1.5V
0V
3V
1.5V
0V
3V
1.5V
0V
3V
1.5V
0V
2573 drw 05
LOW-HIGH-LOW
PULSE
HIGH-LOW-HIGH
PULSE
1.5V
tW
1.5V
2573 drw 06
ENABLE AND DISABLE TIMES
3V
1.5V
0V
VOH
1.5V
VOL
3V
1.5V
0V
2573 drw 07
ENABLE
DISABLE
CONTROL
INPUT
OUTPUT
NORMALLY
LOW
tPZL
SWITCH
CLOSED
tPZH
OUTPUT
NORMALLY
HIGH
SWITCH
OPEN
3V
1.5V
0V
tPLZ
3.5V
3.5V
1.5V
tPHZ
0.3V VOL
1.5V
0.3V VOH
0V
0V
2573 drw 08
NOTES:
1. Diagram shown for input Control Enable-LOW and input Control Disable-
HIGH
2. Pulse Generator for All Pulses: Rate ≤ 1.0MHz; tF ≤ 2.5ns; tR ≤ 2.5ns
6.22
6
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