IRHM7054(2004) Ver la hoja de datos (PDF) - International Rectifier
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IRHM7054 Datasheet PDF : 8 Pages
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PRraed-iIarrtaiodniaCtihoanracteristics
IRHM7054, JANSR2N7394
International Rectifier Radiation Hardened MOSFETs are tested to verify their radiation hardness capability.
The hardness assurance program at International Rectifier is comprised of two radiation environments.
Every manufacturing lot is tested for total ionizing dose (per notes 5 and 6) using the TO-3 package. Both
pre- and post-irradiation performance are tested and specified using the same drive circuitry and test
conditions in order to provide a direct comparison.
Table 1. Electrical Characteristics @ Tj = 25°C, Post Total Dose Irradiation ÄÅ
Parameter
Up to 600K Rads(Si)1 1000K Rads (Si)2 Units Test Conditions
Min Max Min Max
BVDSS
VGS(th)
Drain-to-Source Breakdown Voltage
Gate Threshold Voltage
60
—
2.0 4.0
60
—
V
1.25 4.5
IGSS
IGSS
Gate-to-Source Leakage Forward
Gate-to-Source Leakage Reverse
— 100
— -100
— 100 nA
— -100
IDSS
Zero Gate Voltage Drain Current
RDS(on) Static Drain-to-Source Ã
—
25
— 50 µA
— 0.027 — 0.04 Ω
On-State Resistance (TO-3)
RDS(on) Static Drain-to-Source Ã
— 0.027 — 0.04 Ω
On-State Resistance (TO-254AA)
VSD
Diode Forward Voltage Ã
—
1.4 —
1.4 V
VGS = 0V, ID = 1.0mA
VGS = VDS, ID = 1.0mA
VGS = 20V
VGS = -20 V
VDS= 48V, VGS = 0V
VGS = 12V, ID = 30A
VGS = 12V, ID = 30A
VGS = 0V, IS = 35A
1. Part numbers IRHM7054 ( JANSR2N7394 ), IRHM3054 ( JANSF2N7394 ), IRHM4054 ( JANSG2N7394 )
2. Part number IRHM8054 ( JANSH2N7394 )
International Rectifier radiation hardened MOSFETs have been characterized in heavy ion environment for
Single Event Effects (SEE). Single Event Effects characterization is illustrated in Fig. a and Table 2.
Table 2. Single Event Effect Safe Operating Area
Ion
LET
Energy
MeV/(mg/cm2)) (MeV)
I
59.9
345
Br
36.8
305
Range
VDS(V)
(µm) @VGS=0V @VGS=-5V @VGS=-10V @VGS=-15V @VGS=-20V
32.8 60
60
45
40
30
39
40
35
30
25
20
80
60
BR
40
I
20
0
0
-5 -10 -15 -20
VGS
Fig a. Single Event Effect, Safe Operating Area
For footnotes refer to the last page
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