OP37FP(RevA) Ver la hoja de datos (PDF) - Analog Devices
Número de pieza
componentes Descripción
Lista de partido
OP37FP Datasheet PDF : 16 Pages
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OP37
1. NULL
2. (–) INPUT
3. (+) INPUT
4. V–
6. OUTPUT
7. V+
8. NULL
Wafer Test Limits (VS = ؎15 V, TA = 25؇C for OP37N, OP37G, and OP37GR devices; TA = 125؇C for OP37NT and OP37GT devices,
unless otherwise noted.)
Parameter
Symbol
Input Offset
Voltage
Input Offset
Current
Input Bias
Current
Input Voltage
Range
Common Mode
Rejection Ratio
VOS
IOS
IB
IVR
CMRR
OP37NT
Conditions Limit
Note 1
60
50
± 60
± 10.3
VCM = ± 11 V 108
OP37N
Limit
35
35
± 40
± 11
114
OP37GT
Limit
200
85
± 95
± 10.3
100
OP37G OP37GR
Limit Limit
60
100
50
75
± 55
± 80
± 11
± 11
106
100
Unit
µV MAX
nA MAX
nA MAX
V MIN
dB MIN
Power Supply
Rejection Ratio PSRR
Large-Signal
Voltage Gain AVO
Output Voltage
Swing
VO
Power
Consumption Pd
TA = 25°C,
VS = ± 4 V to
± 18 V
10
TA = 125°C,
VS = ± 4.5 V to
± 18 V
16
RL ≥ 2 kΩ,
VO = ± 10 V
RL ≥ 1 kΩ,
VO = ± 10 V
RL ≥ 2 kΩ
RL ≥ 600 kΩ
600
± 11.5
VO = 0
10
10
20
1000
500
800
± 12
± 11
± 10
140
10
20
1000
800
± 12
± 10
140
700
± 11.5
± 10
170
µV/V MAX
µV/V MAX
V/mV MIN
V/mV MIN
V MIN
V MIN
mW MAX
NOTES
For 25°C characterlstics of OP37NT and OP37GT devices, see OP37N and OP37G characteristics, respectively.
Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed
for standard product dice. Consult factory to negotiate specifications based on dice lot qualification through sample lot assembly and testing.
REV. A
–5–
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