MGA-72543 Ver la hoja de datos (PDF) - HP => Agilent Technologies
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MGA-72543 Datasheet PDF : 22 Pages
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MGA-72543 Electrical Specifications, TC = +25°C, ZO = 50 Ω, Id = 20 mA, Vd = 3 V, unless noted.
Symbol
Parameters and Test Conditions
Units Min. Typ. Max.
σ
Vref test[1] f = 2.0 GHz Vd = 3.0 V (Vds = 2.5 V)
Id = 20 mA V
0.37 0.51
0.65 0.035
NF test[1] f = 2.0 GHz Vd = 3.0 V (=Vds+Vc)
Id = 20 mA dB
1.5
1.8
0.06
Ga test[1] f = 2.0 GHz Vd = 3.0 V (=Vds+Vc)
Id = 20 mA dB
13.5 14.4
15.5 0.13
IIP3 test[1] f = 2.04 GHz Vd = 3.0 V (=Vds+Vc)
Id = 20 mA dB
8.5
10.5
0.67
IL test[1] f = 2.0 GHz Vd = 3.0 V (Vds = 0 V, Vc = 3 V) Id = 0.0 mA dB
2.5
3.5
0.01
Ig test[1] f = 2.0 GHz Vd = 3.0 V (Vds = 0 V, Vc = 3 V) Id = 0.0 mA uA
2.0
2.0
NFo[2]
Minimum Noise Figure
f = 1.0 GHz dB
1.35
As measured in Figure 2 Test Circuit
f = 1.5 GHz
1.38
(Γopt computed from s-parameter and
f = 2.0 GHz
1.42
0.04
noise parameter performance as measured f = 2.5 GHz
1.45
in a 50 Ω impedance fixture)
f = 4.0 GHz
1.54
f = 6.0 GHz
1.70
Ga[2]
Associated Gain at NFo
f = 1.0 GHz dB
14.8
As measured in Figure 2 Test Circuit
f = 1.5 GHz
14.2
(Γopt computed from s-parameter and
f = 2.0 GHz
13.6
0.11
noise parameter performance as measured f = 2.5 GHz
13.0
in a 50 Ω impedance fixture)
f = 4.0 GHz
11.2
f = 6.0 GHz
9.2
P1dB[1] Output Power at 1 dB Gain Compression
Id = 0 mA dBm
+15 .3
As measured in Figure 1 Test Circuit
Id = 5 mA
+3.2
Frequency = 2.04 GHz
Id = 10 mA
+8.3
Id = 20 mA
+11.2
0.52
Id = 40 mA
+14.9
Id = 60 mA
+17.1
IIP3[1]
Input Third Order Intercept Point
Id = 0 mA dBm
+35
As measured in Figure 1 Test Circuit
Id = 5 mA
+3.5
Frequency = 2.04 GHz
Id = 10 mA
+6.2
Id = 20 mA
+10.5
0.67
Id = 40 mA
+12.1
Id = 60 mA
+14.8
ACP
Adjacent Channel Power Rejection,
f = 2 GHz, offset = 1.25 MHz, Pout = 10 dBm Id = 30 mA dBc
-55
(CDMA modulation scheme)
Id = 40 mA
-60
f = 800 MHz, offset = 900 KHz, Pout = 8 dBm Id = 20 mA
-57
As measured in Figure 1 Test Circuit
Id = 30 mA
-60
RL
[1]
in
Input Return Loss as measured in Fig. 1
f = 2.0 GHz dB
10.2
0.22
RL
[1]
out
Output Return Loss as measured in Fig. 1 f = 2.0 GHz dB
19.5
1.1
ISOL[1] Isolation |S12|2 as measured in Fig. 2
f = 2.0 GHz dB
-23.2
0.16
Notes:
1. Standard Deviation and Typical Data as measured in the test circuit in Figure 1. Data based at least 500 part sample size
and 3 wafer lots.
2. Typical data computed from s-parameter and noise parameter data measured in a 50Ω system. Data based on 40 parts
from 3 wafer lots.
960 pF
RF
Input
2.7 nH
50 pF
3
Vref
1000 Ω
4
Vd
56 pF
1
RF
18 nH
Output
2
56 pF
RF
Input
Bias Tee
Vref
ICM Fixture
Vd
Bias
Tee
RF
Output
Figure 1. MGA-72543 Production Test Circuit.
Figure 2. MGA-72543 Test Circuit for S, Noise, and
Power Parameters Over Frequency.
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