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EMIF02-600

10-BIT WIDE EMI FILTER INCUDING ESD PROTECTION

STMicroelectronics 

EMIF02-600FU7

Fig A5 : Remaining voltage at both stages S1 (Vin) and S2 (Vout) during ESD surge

a) Positive surge

b) Negative surge

Please note that the EMIF02-600FU7 is not only acting for positive ESD surges but also for negative ones. For these kind

of disturbances it clamps close to ground voltage as shown in Fig. A5b.

NOTE: DYNAMIC RESISTANCE MEASUREMENT

As the value of the dynamic resistance remains stable for a

surge duration lower than 20µs, the 2.5µs rectangular surge

is well adapted. In addition both rise and fall times are

optimized to avoid any parasitic phenomenon during the

measurement of Rd.

Fig A6 : Rd measurement current wave

I

IPP

t

2 µs

2.5 µs

2.5µs duration measurement wave

CROSSTALK BEHAVIOR

1- Crosstalk phenomena

Fig A7 : Crosstalk phenomena

RG1

line 1

VG1

RG2

line 2

RL1

α VG1 β VG2

VG2

RL2

α VG2 β VG1

DRIVERS

RECEIVERS

The crosstalk phenomena are due to the coupling between 2 lines. The coupling factor ( β12 or β21 ) increases when the

gap across lines decreases, particularly in silicon dice. In the example above the expected signal on load RL2 is α2VG2, in

fact the real voltage at this point has got an extra value β21VG1. This part of the VG1 signal represents the effect of the

crosstalk phenomenon of the line 1 on the line 2. This phenomenon has to be taken into account when the drivers impose

fast digital data or high frequency analog signals in the disturbing line. The perturbed line will be more affected if it works

with low voltage signal or high load impedance (few kΩ). The following chapters give the value of both digital and analog

crosstalk.

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