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74F640

Octal bus transceiver, inverting (3-State)

Philips Electronics 

Philips Semiconductors

Octal bus transceiver, inverting (3-State)

Product specification

74F640

DC ELECTRICAL CHARACTERISTICS

(Over recommended operating free-air temperature range unless otherwise noted.)

SYMBOL

PARAMETER

TEST CONDITIONSNO TAG

LIMITS

MIN

TYP

NO TAG

MAX

UNIT

VOH

High-level output voltage

A0–A7

B0–B7

VCC = MIN,

VIL = MAX,

IOH = –3mA

±10%VCC

±5%VCC

2.4

2.7

3.3

B0–B7 VIH = MIN

IOH = –15mA

±10%VCC

±5%VCC

2.0

2.0

V

V

V

V

±10%VCC

A0–A7

VCC = MIN,

IOL = 24mA

±5%VCC

VOL

Low-level output voltage

B0–B7

VIL = MAX,

VIH = MIN,

IOL = MAX

±10%VCC

±5%VCC

0.35 0.50

V

0.35 0.50

V

0.55

V

0.42 0.55

V

VIK

Input clamp voltage

VCC = MIN, II = IIK

–0.73 –1.2

V

II

Input current at maximum

input voltage

OE,

T/R

VCC = 0.0V, VI = 7.0V

A0–A7,

B0–B7

VCC = 5.5V, VI = 5.5V

100

µA

1.0

mA

IIH

High-level input current

OE, VCC = MAX, VI = 2.7V

T/R

IIL

Low-level input current

only VCC = MAX, VI = 0.5V

40

µA

–40

µA

IOZH+IIH

Off-state output current,

High level of voltage applied

VCC = MAX, VI = 2.7V

70

µA

IOZL+IIL

Off-state output current,

Low level of voltage applied

VCC = MAX, VI = 0.5V

–70

µA

IOS

Short-circuit output cur-

rentNO TAG

A0–A7

VCC = MAX

B0–B7

–60

–100

–150

mA

–225

µA

ICCH

T/R = An = 4.5V,

OE = GND

66

85

mA

ICC

Supply current (total)

ICCL VCC = MAX T/R = Bn = OE = GND

91

120

mA

ICCZ

T/R = Bn = GND,

OE = 4.5V

78

102

mA

NOTES:

1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.

2. All typical values are at VCC = 5V, Tamb = 25°C.

3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold

techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting

of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any

sequence of parameter tests, IOS tests should be performed last.

1989 Nov 27

5

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