PI6C2409 Ver la hoja de datos (PDF) - Pericom Semiconductor
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PI6C2409 Datasheet PDF : 8 Pages
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PI6C2409
Zero Delay Clock Buffer 1122334455667788990011223344556677889900112233445566778899001122112233445566778899001122334455667788990011223344556677889900112211223344556677889900112233445566778899001122334455667788990011221122334455667788990011223344556677889900112233445566778899001122112233445566778899001122
DC Electrical Characteristics for Commercial Temperature Devices
Parameter
Description
Test Conditions
VIL
Input LOW Voltage
VIH
Input HIGH Voltage
IIL
Input LOW Current VIN = 0V
IIH
Input HIGH Current VIN = VDD
VO L
Output LOW Voltage IOL = 8mA (–1); IOL = 12mA (–1H)
VO H
Output HIGH Voltage IOH = –8mA (–1); IOH = –12mA (–1H)
IDD
Bypass, PLL off
SEL1 = 0 SEL2 = 1
IDD
Supply Current
Unloaded outputs, 66.67 MHz, Select inputs at VDD or GND
IDD
Supply Current
Unloaded outputs 100 MHz Select Inputs @ VDD or GND
Min.
2.0
2.4
Max.
0.8
50
125
0.4
1.0
39
54
Units
V
µA
V
mA
AC Electrical Characteristicsfor Commercial Temperature Device
Parameters
N ame 1
Test Conditions
FO
Output Frequency
30pF load (–1, –1H)
10pF load, (–1, –1H)
tDC
Duty Cycle (–1H)
Measured at VDD/2, FO< 50 MHz
Duty Cycle (–1,–1H)
Measured at VDD/2, FO= 66 MHz
tR
Rise Time (–1)
Rise Time (–1H)
tF
Fall Time (–1)
Measured between 0.8V and 2.0V
Fall Time (–1H)
tSK(O) Output to Output Skew (–1,–1H)
All outputs equally loaded, VDD/2
Min. Typ. Max. Units
100
10
MHz
133
45 50 55
%
40 50 60
2.5
1.5
ns
2.5
1.5
250
t0
Input to Output Delay, CLKIN
Rising Edge to OUT0 Rising Edge Measured at VDD/2
(–1,–1H)
tSK(D) Device to Device Skew (–1,–1H) Measured at VDD/2 on OUT0 pins of devices
tSLEW Output Slew Rate (–1,–1H)
Measured between 0.8V and 2.0V on –1H
device using Test Circuit #2
1
tJIT
Cycle-to-Cycle Jitter (–1,–1H)
Measured at 66.67 MHz, loaded 30pF outputs
tLOCK PLL Lock Time (–1,–1H)
Stable power supply, valid clocks
presented on CLKIN pins
0 ±350 ps
0 700
V/ns
200 ps
1.0 ms
Notes:
1. See Switching Waveforms on page 6
5
PS8613A
07/15/03
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