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SAA7114

PAL/NTSC/SECAM video decoder with adaptive PAL/NTSC comb filter, VBI data slicer and high performance scaler

Philips Electronics 

Philips Semiconductors

PAL/NTSC/SECAM video decoder with adaptive PAL/NTSC

comb filter, VBI data slicer and high performance scaler

Product specification

SAA7114

PIN

SYMBOL

TYPE(1)

LQFP100 BGA156

DESCRIPTION

XPD0

90

N1

I/O LSB of expansion port data

XRV

91

L5

I/O vertical reference I/O expansion port

XRH

92

N2

I/O horizontal reference I/O expansion port

VDDD(ICO6)

93

XCLK

94

L4

P internal digital core supply voltage 6 (+3.3 V)

M3

I/O clock I/O expansion port

XDQ

95

M4

I/O data qualifier I/O expansion port

XRDY

96

N3

O task flag or ready signal from scaler, controlled by XRQT

TRST

97

N4

I/pu test reset input (active LOW), for boundary scan test (with internal

pull-up); notes 6 and 7

TCK

98

M6

I/pu test clock for boundary scan test; note 2

TMS

99

M5

I/pu test mode select input for boundary scan test or scan test; note 2

VSSD(EP4)

100

L6

P external digital pad supply ground 4

Notes

1. I = input, O = output, P = power, pu = pull-up.

2. In accordance with the “IEEE1149.1” standard the pads TDI, TMS, TCK and TRST are input pads with an internal

pull-up transistor and TDO is a 3-state output pad.

3. Pin strapping is done by connecting the pin to the supply via a 3.3 kΩ resistor. During the power-up reset sequence

the corresponding pins are switched to input mode to read the strapping level. For the default setting no strapping

resistor is necessary (internal pull-down).

4. Pin RTCO operates as I2C-bus slave address pin; RTCO = 0 slave address 42H/43H (default); RTCO = 1 slave

address 40H/41H.

5. Pin ALRCLK: 0 = 24.576 MHz crystal (default); 1 = 32.110 MHz crystal.

6. For board design without boundary scan implementation connect the TRST pin to ground.

7. This pin provides easy initialization of the Boundary Scan Test (BST) circuit. TRST can be used to force the Test

Access Port (TAP) controller to the TEST_LOGIC_RESET state (normal operation) at once.

2004 Mar 03

10

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