XC835/836
Package and Quality Declaration
4.3
Quality Declaration
Table 25 shows the characteristics of the quality parameters in the XC835/836.
Table 25 Quality Parameters
Parameter
Symbol Limit Values
Unit Notes
Min.
Max.
Operation Lifetime when tOP1
-
the device is used at the
-
three stated TJ1)
-
Operation Lifetime when tOP2
-
the device is used at the
stated TJ1)
ESD susceptibility
VHBM
-
according to Human Body
Model (HBM)
1500
15000
1500
131400
hours
hours
hours
hours
TJ = 150°C
TJ = 110°C
TJ = -40°C
TJ = 27°C
2000
V
Conforming to
EIA/JESD22-
A114-B2)
ESD susceptibility
according to Charged
VCDM
-
Device Model (CDM) pins
500
V
Conforming to
JESD22-C101-C2)
1) This lifetime refers only to the time when device is powered-on.
2) Not all parameters are 100% tested, but are verified by design/characterisation and test correlation.
Data Sheet
50
V1.2, 2011-03