MX27C8100MC-10 Ver la hoja de datos (PDF) - Macronix International

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MX27C8100MC-10

Access time 200ns; 8K-bit (1M x 8/512K x 16) CMOS OTP ROM

Macronix International 

SWITCHING TEST CIRCUITS

DEVICE

UNDER

TEST

CL

6.2K ohm

MX27C8100

1.8K ohm

+5V

DIODES = IN3064

OR EQUIVALENT

CL = 100 pF including jig capacitance

SWITCHING TEST WAVEFORMS

AC driving levels

2.0V

0.8V

TEST POINTS

INPUT

AC TESTING: AC driving levels are 2.4V/0.4V.

Input pulse rise and fall times are < 10ns.

2.0V

0.8V

OUTPUT

P/N: PM0261

REV. 2.4, NOV. 19, 2002

6

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