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TLP708(2012) Ver la hoja de datos (PDF) - Toshiba

Número de pieza
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Lista de partido
TLP708 Datasheet PDF : 13 Pages
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TLP708,TLP708F
Switching Characteristics
(Unless otherwise specified, Ta = -40 to 125°C, VCC = 4.5 to 5.5 V)
Test
Characteristic
Symbol Circuit
Test Conditions
Min.
Propagation delay time to logic low
output
Propagation delay time to logic high
output
tpHL
tpLH
IF=07.5mA
RL=350Ω
CL=15pF
IF=7.50mA
(Note 4)
Switching time dispersion between |tpHL-
5
RL=350Ω
ON and OFF
tpLH|
IF=07.5mA
CL=15pF
Propagation delay skew (Note 5)
tpsk
(Note 4)
-50
Output fall time90-10%
tf
Output rise time1090%
tr
IF=07.5mA
RL =350Ω
CL=15pF
IF=7.50mA
(Note 4)
Common mode transient immunity
at high level output
CMH
VCM=1000Vp-p , IF=0mA,
6
VCC=5V , Ta=25
+15
Common mode transient immunity
VCM=1000Vp-p , IF=10mA,
at low level output
CML
VCC=5V , Ta=25
-15
*All typical values are at Ta=25
Typ.*
35
35
12
6
18
Max. Unit
75
ns
75
ns
35
ns
50
ns
ns
ns
— kV/μs
— kV/μs
Note 3 : A ceramic capacitor (0.1μF) should be connected from pin 6 (VCC) to pin 4 (GND) to stabilize the operation of the high gain
linear amplifier. Failure to provide the bypass may impair the switching property. The total lead length between the capacitor
and coupler should not exceed 1 cm.
Note 4 : f=5MHz, duty=50%, input current tr=tf=4.5ns,
CL is approximately 15pF which includes probe and ig/stray wiring capacitance.
Note 5: Propagation delay skew is defined as the difference between the largest and smallest propagation delay times (i.e. tpHL or
tpLH) of multiple samples. Evaluations of these samples are conducted under identical test conditions (supply voltage, input
current, temperature, etc).
TEST CIRCUIT 1: IOH Test Circuit
TEST CIRCUIT 2: VOL Test Circuit
1
VF 2
3
SHIELD
6
0.1μF
5
IOH
A
4
VO
VCC
1
2
IF
3
SHIELD
6
0.1μF
5
VOL IO VCC
4V
TEST CIRCUIT 3: ICCL Test Circuit
ICCL
1
6
A
2
IF
3
SHIELD
5
0.1 μF
4
VCC
TEST CIRCUIT 4: ICCH Test Circuit
1
2
3
SHIELD
6
ICCH
A
5
0.1 μF
4
VCC
4
2012-08-07

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