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A42L2604V-50 Ver la hoja de datos (PDF) - AMIC Technology

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A42L2604V-50
AMICC
AMIC Technology AMICC
A42L2604V-50 Datasheet PDF : 25 Pages
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A42L2604 Series
4M X 4 CMOS DYNAMIC RAM WITH EDO PAGE MODE
Features
Organization: 4,194,304 words X 4 bits
Part Identification
- A42L2604 (2K Ref.)
Single 3.3V power supply/built-in VBB generator
Low power consumption
- Operating: 80mA (-45 max)
- Standby: 1.0mA (TTL), 1.5mA (CMOS),
350µA (Self-refresh current)
High speed
- 45/50 ns RAS access time
- 20/22 ns column address access time
- 12/13 ns CAS access time
- 18/20 ns EDO Page Mode Cycle Time
General Description
The A42L2604 is a new generation randomly accessed
memory for graphics, organized in a 4,194,304-word by 4-
bit configuration. This product can execute Write and
Read operation via CAS pin.
The A42L2604 offers an accelerated Fast Page Mode
cycle with a feature called Extended Data Out (EDO).
Pin Configuration
SOJ
TSOP
VCC 1
I/O0
2
I/O1
3
WE 4
RAS 5
NC 6
A10 8
A0 9
A1 10
A2 11
A3 12
VCC 13
26 VSS
25
I/O3
24
I/O2
23 CAS
22 OE
21 A9
19 A8
18 A7
17 A6
16 A5
15 A4
14 VSS
VCC 1
I/O0
2
I/O1
3
WE 4
RAS 5
NC 6
A10 8
A0 9
A1 10
A2 11
A3 12
VCC 13
26
VSS
25
I/O3
24
I/O2
23
CAS
22
OE
21
A9
19
A8
18
A7
17
A6
16
A5
15
A4
14
VSS
Industrial operating temperature range: -40°C to +85°C
for -U
Fast Page Mode with Extended Data Out
2K Refresh Cycle in 32ms
Read-modify-write, RAS -only, CAS -before- RAS ,
Hidden refresh capability
TTL-compatible, three-state I/O
JEDEC standard packages
- 300mil, 24/26-pin SOJ
- 300mil, 24/26-pin TSOP type II package
This allow random access of up to 2048(2K Ref.) words
within a row at a 56/50 MHz EDO cycle, making the
A42L2604 ideally suited for graphics, digital signal
processing and high performance computing systems.
Pin Descriptions
Symbol
A0 – A10
I/O0 - I/O3
RAS
CAS
WE
OE
VCC
VSS
NC
Description
Address Inputs (2K product)
Data Input/Output
Row Address Strobe
Column Address Strobe
Write Enable
Output Enable
3.3V Power Supply
Ground
No Connection
(October, 2004, Version 1.2)
1
AMIC Technology, Corp.

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