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HI3256JCQ Ver la hoja de datos (PDF) - Intersil

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HI3256JCQ Datasheet PDF : 16 Pages
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HI3256
TABLE 1. A/D CODE
INV
1
0
VIN STEP D7
D0 D7
D0
VRT
255 1 1 1 1 1 1 1 1 0 0 0 0 0 0 0 0
254 1 1 1 1 1 1 1 0 0 0 0 0 0 0 0 1
VRM2
128 1 0 0 0 0 0 0 0 0 1 1 1 1 1 1 1
127 0 1 1 1 1 1 1 1 1 0 0 0 0 0 0 0
1 0000000111111110
VRB
0 0000000011111111
Notes on Operation
• The HI3256 is a high-speed A/D converter which is capable
of TTL, ECL and PECL level clock input. Characteristic
impedance should be properly matched to ensure optimum
performance during high-speed operation.
• The power supply and grounding have a profound influence
on converter performance. The power supply and
grounding method are particularly important during high-
speed operation. General points for caution are as follows:
- The ground pattern should be as large as possible. It is
recommended to make the power supply and ground
patterns wider at an inner layer using a multi-layer
board.
- To prevent interference between AGND and DGND
and between AVCC and DVCC, make sure the
respective patterns are separated. To prevent a DC
offset in the power supply pattern, connect the AVCC
and DVCC lines at one point each, via a ferrite-bead
filter. Shorting the AGND and DGND patterns in one
place immediately under the A/D converter improves
A/D converter performance.
- Ground the power supply pins (AVCC, DVCC1, DVCC2,
DVEE3) as close to each pin as possible with a 0.1µF
or larger ceramic chip capacitor. (Connect the AVCC
pin to the AGND pattern and the DVCC1, DVCC2,
DVEE3 pins to the DGND pattern).
- The digital output wiring should be as short as
possible. If the digital output wiring is long, the wiring
capacitance will increase, deteriorating the output slew
rate and resulting in reflection to the output waveform
since the original output slew rate is quite fast.
• The analog input pin VIN has an input capacitance of
approximately 21pF. To drive the A/D converter with proper
frequency response, it is necessary to prevent performance
deterioration due to parasitic capacitance or parasitic
inductance by using a large capacity drive circuit; keeping
wiring as short as possible, and using chip parts for
resistors and capacitors, etc.
• The VRT and VRB pins must have adequate bypass to
protect them from high-frequency noise. Bypass them to
AGND with approximately 1µF tantal capacitor and, 0.1µF
capacitor. At this time, approximately DGND3 - 1.2V voltage
is generated. However, this is not recommended for use as
threshold voltage VBB as it is too weak.
When the digital input level is PECL level, ***/E pins should
be used and ***/T pins left open. When the digital input level
is TTL, ***/T pins should be used and III/E pins left open.
Test Circuits
4V
1.95V
2V
VRT
VIN
VRB
5V
5V
A ICC
AVCC
DVCC1
DVCC2
A IEE
DGND3
CLK/E
5MHz PECL
DGND2
DGND1
AGND
DVEE3
FIGURE 4. CURRENT CONSUMPTION MEASUREMENT
CIRCUIT
+V
S2
-
+
S1 S1: ON WHEN A < B
S2: ON WHEN A > B
VIN
DVM
HI3256
-V
A<B A>B
COMPARATOR
8
A8 B8
TO TO
8
BUFFER
A1 B1
A0 B0
“0”
“1”
CONTROLLER
000...00
TO
111..10
FIGURE 5. INTEGRAL LINEARITY ERROR/DIFFERENTIAL
LINEARITY ERROR MEASUREMENT CIRCUIT
9

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