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AS273D1D13

Over-Temperature Detector

Astec Semiconductor => Silicon Link 

Over-Temperature Detector

AS273

Theory of Operation

The AS273 is an over-temperature detector that

gives an over-temp signal when the device

junction temperature exceeds a programmed

over-temp threshold. Over-temp threshold pro-

gramming is accomplished by controlling the

magnitude of the reference shunt current.

Over-temperature Condition

Internal to the AS273 is a temperature sensor

which creates a voltage proportional to the

absolute temperature (PTAT) of the die. This

PTAT voltage is compared with a fraction of the

reference voltage corresponding to the over-

temperature threshold. When the PTAT voltage

exceeds the reference voltage, the comparator is

tripped and an over-temp signal is given to the

output. The output consists of an open collector

transistor that pulls low on an over-temp condi-

tion. Built into the comparator is temperature hys-

teresis, which keeps the over-temp signal until

the junction temperature has fallen 5¡C (or 10¡C)

below the over-temp threshold. Figure 9 shows

the output of the AS273 (with 10¡C of hysteresis)

over a range of junction temperature.

IREF = 4 mA

5

0

IREF = 2 mA

5

0

IREF = 1 mA

5

0

OT1-10

OT1-5

OT1

OT2

OT3

Junction Temperature, TJ (°C)

Figure 9. Temperature Characteristic of Output with 10¡C of Hysteresis

ASTEC Semiconductor

7

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