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CYIL2SM1300-EVAL
ON-Semiconductor
ON Semiconductor ON-Semiconductor
CYIL2SM1300-EVAL Datasheet PDF : 41 Pages
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CYIL2SM1300AA
Table 13. Internal Registers (continued)
Block
Sequencer
Register Name Address [6..0]
seqmode1
56
seqmode2
57
seqmode3
58
Field
[0]
[1]
[2]
[3]
[4]
[5]
[6]
[7]
[4:0]
[6:5]
[0]
[1]
[2]
[5:3]
[6]
[7]
Reset Value
Description
0
Enables image capture
1
‘1’: Master mode, integration timing is generated
on-chip
‘0’: Slave mode, integration timing is controlled
off-chip through INT_TIME1, INT_TIME2 and
INT_TIME3 pins
0
‘0’: Pipelined mode
‘1’: Triggered mode
0
Enables(‘1’)/disables(‘0’) subsampling
0
‘1’: Color subsampling scheme: 1:1:0:0:1:1:0:0
‘0’: B&W subsampling scheme: 1:0:1:0:1
0
Enable dual slope
0
Enable triple slope
0
Enables continued row select (that is, assert row
select during pixel read out)
‘10000’
Must be overwritten with‘10001’ to this register after
startup, before readout.
‘00’
Number of active windows:
“00”: 1 window
“01”: 2 windows
“10”: 3 windows
“11”: 4 windows
‘1’
Enables the generation of the CRC10 on the data
and sync channels
‘0’
Not applicable
‘0’
Enable column fpn calibration
“001”
Number of frames in nondestructive read out:
“000”: invalid
“001”: one reset, one sample (default mode)
“010”: one reset, two samples
0
Controls the granularity of the timer settings (only for
those that have ‘granularity selectable’ in the
description):
‘0’: Expressed in number of lines
‘1’: Expressed in clock cycles (multiplied by
2**seqmode4[3:0])
0
Allows delaying the syncing of events that happen
outside of ROT to the next ROT. This avoids image
artefacts.
Document Number: 001-24599 Rev. *C
Page 13 of 41
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