MAL205743221E3 Ver la hoja de datos (PDF) - Vishay Semiconductors
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MAL205743221E3
Vishay Semiconductors
MAL205743221E3 Datasheet PDF : 11 Pages
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056/057 PSM-SI
Vishay BCcomponents
Table 4
MULTIPLIER OF RIPPLE CURRENT (IR) AS A FUNCTION OF FREQUENCY
FREQUENCY (Hz)
UR
(V)
50
100
200
400
1000
2000
IR MULTIPLIER
10
0.93
1.00
1.04
1.07
1.11
1.13
16
0.93
1.00
1.04
1.07
1.11
1.13
25
0.93
1.00
1.04
1.07
1.11
1.13
40
0.91
1.00
1.05
1.09
1.13
1.15
63
0.91
1.00
1.05
1.09
1.13
1.15
100
0.91
1.00
1.05
1.09
1.13
1.15
200
0.86
1.00
1.13
1.21
1.29
1.32
250
0.86
1.00
1.13
1.21
1.29
1.32
385
0.86
1.00
1.13
1.21
1.29
1.32
400
0.86
1.00
1.13
1.21
1.29
1.32
450
0.86
1.00
1.13
1.21
1.29
1.32
4000
1.15
1.15
1.15
1.18
1.18
1.18
1.35
1.35
1.35
1.35
1.35
10 000
1.18
1.18
1.18
1.22
1.22
1.22
1.40
1.40
1.40
1.40
1.40
Table 5
ENDURANCE TEST DURATION AND USEFUL LIFE
UR
ENDURANCE
(V)
AT 85 °C (h)
10
5000
16
5000
25
5000
40
5000
63
5000
100
5000
200
5000
250
5000
385
5000
400
5000
450
2000
Note
• Multiplier of useful life code: MGA453
USEFUL LIFE
AT 85 °C (h)
12 000
12 000
12 000
12 000
12 000
12 000
12 000
12 000
12 000
12 000
5000
Table 6
TEST PROCEDURES AND REQUIREMENTS
TEST
NAME OF TEST
REFERENCE
PROCEDURE
(quick reference)
REQUIREMENTS
Endurance
IEC 60384-4 /
EN130300
subclause 4.13
Tamb = 85 C; UR applied;
5000 h (450 V types: 2000 h)
UR 100 V; C/C: ± 15 %
UR > 100 V; C/C: ± 10 %
ESR 1.3 x spec. limit
Z 2 x spec. limit
IL5 spec. limit
UR 100 V; C/C: ± 45 %
UR > 100 V; C/C: ± 30 %
ESR 3 x spec. limit
Z 3 x spec. limit
Useful life
CECC 30301
subclause 1.8.1
Tamb = 85 C; UR and IR applied;
12 000 h (450 V types: 5000 h)
IL5 spec. limit
no short or open circuit,
no visible damage
total failure percentage:
Shelf life
(storage at
high temperature)
IEC 60384-4 /
EN130300
subclause 4.17
Tamb = 85 C; no voltage applied; 500 h
after test: UR to be applied for 30 min,
24 h to 48 h before measurement
UR 100 V; 1 %
UR 100 V; 3 %
C/C: ±10 %
ESR 1.2 x spec. limit
IL5 2 x spec. limit
Statements about product lifetime are based on calculations and internal testing. They should only be interpreted as estimations. Also due to external factors, the
lifetime in the field application may deviate from the calculated lifetime. In general, nothing stated herein shall be construed as a guarantee of durability.
Revision: 21-Nov-2018
10
Document Number: 28340
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