LH531000BN Ver la hoja de datos (PDF) - Sharp Electronics

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LH531000BN

CMOS 1M (128K × 8) MROM

Sharp Electronics 

LH531000B

AC TEST CONDITIONS

PARAMETER

Input voltage amplitude

Input rise/fall time

Input reference level

Output reference level

Output load condition

RATING

0.6 V to 2.4 V

10 ns

1.5 V

0.8 V and 2.2 V

1TTL +100 pF

tRC

A0 - A16

CE

OE

OE

tAA

(NOTE)

tACE

(NOTE)

tOE

(NOTE)

tCHZ

tOHZ

tOH

D0 - D7

NOTE: Data becomes valid after tAA, tACE, and tOE from address

input, chip enable, and output enable, respectively have been met.

DATA VALID

Figure 3. Timing Diagram

CMOS 1M MROM

531000B-3

4

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