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74ALVT16827DL

20-bit buffer/line driver; non-inverting; 3-state

NXP Semiconductors. 

Philips Semiconductors

74ALVT16827

20-bit buffer/line driver; non-inverting; 3-state

VI

negative

pulse

0V

90 %

VI

positive

pulse

0V

10 %

tW

VM

10 %

tTHL(tf)

tTLH(tr)

90 %

VM

tW

VM = 1.5 V.

a. Input pulse definition

90 %

VM

tTLH(tr)

tTHL(tf)

VM

10 %

001aac221

VCC

VI

PULSE

GENERATOR

VO

DUT

RT

VEXT

RL

CL

RL

mna616

Test data is given in Table 9.

Definitions test circuit:

RL = Load resistor.

CL = Load capacitance including jig and probe capacitance.

RT = Termination resistance should be equal to output impedance Zo of the pulse generator.

VEXT = Test voltage for switching times.

b. Test circuit

Fig 7. Load circuitry for switching times

Table 9: Test data

Input

VI

3.0 V or VCC

whichever is

less

fi

≤ 10 MHz

Load

tW

tr, tf

CL

RL

500 ns ≤ 2.5 ns 50 pF 500 Ω

VEXT

tPLH, tPHL tPZH, tPHZ tPZL, tPLZ

6 V or open

VCC × 2

GND

9397 750 15122

Product data sheet

Rev. 03 — 2 June 2005

© Koninklijke Philips Electronics N.V. 2005. All rights reserved.

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