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74ABT373

Octal Transparent Latch with 3-STATE Outputs

Fairchild Semiconductor 

DC Electrical Characteristics

Symbol

Parameter

VIH Input HIGH Voltage

VIL Input LOW Voltage

VCD Input Clamp Diode Voltage

VOH Output HIGH Voltage

VOL Output LOW Voltage

IIH Input HIGH Current

IBVI Input HIGH Current

Breakdown Test

IIL Input LOW Current

VID Input Leakage Test

I OZH

I OZL

IOS

ICEX

IZZ

ICCH

I CCL

ICCZ

Output Leakage Current

Output Leakage Current

Output Short-Circuit Current

Output HIGH Leakage Current

Bus Drainage Test

Power Supply Current

Power Supply Current

Power Supply Current

ICCT Additional Outputs Enabled

ICC/Input Outputs 3-STATE

Outputs 3-STATE

ICCD Dynamic ICC No Load(3)

VCC

Min.

Min.

Min.

Max.

Max.

Conditions

Recognized HIGH Signal

Recognized LOW Signal

IIN = –18mA

IOH = –3mA

IOH = –32mA

IOL = 64mA

VIN = 2.7V(3)

VIN = VCC

VIN = 7.0V

Max.

0.0

VIN = 0.5V(3)

VIN = 0.0V

IID = 1.9µA, All Other Pins

Grounded

0–5.5V VOUT = 2.7V, OE = 2.0V

0–5.5V VOUT = 0.5V, OE = 2.0V

Max. VOUT = 0.0V

Max. VOUT = VCC

0.0 VOUT = 5.5V, All Others GND

Max. All Outputs HIGH

Max. All Outputs LOW

Max. OE = VCC, All Others at VCC

or Ground

Max.

Max.

VI = VCC – 2.1V

Enable Input VI = VCC – 2.1V

Data Input VI = VCC – 2.1V,

All Others at VCC or Ground

Outputs OPEN, LE = VCC,

OE = GND(2),

One-Bit Toggling,

50% Duty Cycle

Notes:

2. For 8-bit toggling, ICCD < 0.8mA/MHz.

3. Guaranteed, but not tested.

Min.

2.0

2.5

2.0

Typ.

Max. Units

V

0.8

V

–1.2 V

V

0.55 V

1

µA

1

7

µA

–1

µA

–1

4.75

V

–100

10

µA

–10 µA

–275 mA

50

µA

100 µA

50

µA

30 mA

50

µA

2.5 mA

2.5 mA

2.5 mA

0.12 mA/

MHz

©1993 Fairchild Semiconductor Corporation

74ABT373 Rev. 1.4

4

www.fairchildsemi.com

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