R3111Q601B-TR-F Ver la hoja de datos (PDF) - RICOH Co.,Ltd.
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R3111Q601B-TR-F Datasheet PDF : 44 Pages
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TEST CIRCUITS
ISS
VDD
VIN
R3111x
Series
GND
Supply Current Test Circuit
R3111x
5V
VDD
470Ω
VIN
R3111x
Series OUT
VOUT
GND
Detector Threshold Test Circuit
(Pull-up circuit is not necessary for
CMOS Output type.)
VDD
IOUT
VIN
R3111x
Series OUT
GND
VDS
Nch Driver Output Current Test Circuit
VDD
VDS
IOUT
VIN
R3111x
Series OUT
GND
VDD−VDS
Pch Driver Output Current Test Circuit
∗Apply to CMOS Output type only
+VDET+2.0V
0.7V
VSS
P.G.
VDD
R3111x
Series OUT
GND
5V
ROUT
470kΩ
OUT
COUT
VDS
+VDET+2.0V
0.7V
VSS
P.G.
RIN
470kΩ
VDD R3111x
Series
OUT
5V
ROUT
470kΩ
OUT
CIN
GND
VDS
Output Delay Time Test Circuit (1)
(Pull-up circuit is not necessary for
CMOS Output type.)
Output Delay Time Test Circuit (2)
17
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