HD74LV00A Ver la hoja de datos (PDF) - Hitachi -> Renesas Electronics

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HD74LV00A

Quad. 2-input NAND Gates

Hitachi -> Renesas Electronics 

Test Circuit

Measurement point

CL*

HD74LV00A

Note: CL includes the probe and fig capacitance.

• Waveform – 1

tr

tf

90%

90%

VCC

Input

50% VCC

50% VCC

10%

10%

0V

tPLH

tPHL

In phase output

tPHL

50% VCC

50% VCC

tPLH

VOH

VOL

Out of phase output

VOH

50% VCC

50% VCC

VOL

Notes: 1. Input waveform: PRR ≤ 1 MHz, Zo = 50 Ω, tr ≤ 3 ns, tf ≤ 3 ns

2. The output are measured one at a time with one transition per measurement.

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