EV-ADF4196SD1Z Ver la hoja de datos (PDF) - Analog Devices

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EV-ADF4196SD1Z

Low Phase Noise, Fast Settling, 6 GHz PLL Frequency Synthesizer

Analog Devices 

Data Sheet

ABSOLUTE MAXIMUM RATINGS

TA = 25°C, unless otherwise noted.

Table 3.

Parameter

AVDD to Ground

AVDD to DVDD1, DVDD2, DVDD3, SDVDD

VP1, VP2, VP3 to Ground

VP1, VP2, VP3 to AVDD

Digital I/O Voltage to Ground

Analog I/O Voltage to Ground

REFIN, RFIN+, RFIN− to Ground

Operating Temperature Range

Industrial

Storage Temperature Range

Maximum Junction Temperature

Reflow Soldering

Peak Temperature

Time at Peak Temperature

Rating

−0.3 V to +3.6 V

−0.3 V to +0.3 V

−0.3 V to +5.8 V

−0.3 V to +5.8 V

−0.3 V to VDD + 0.3 V

−0.3 V to VP1, VP2, VP3 + 0.3 V

−0.3 V to VDD + 0.3 V

−40°C to +85°C

−65°C to +125°C

150°C

260°C

40 sec

Stresses at or above those listed under Absolute Maximum

Ratings may cause permanent damage to the product. This is a

stress rating only; functional operation of the product at these

or any other conditions above those indicated in the operational

section of this specification is not implied. Operation beyond

the maximum operating conditions for extended periods may

affect product reliability.

This device is a high performance RF integrated circuit with

an ESD rating of <2 kV, and it is ESD sensitive. Take proper

precautions for handling and assembly.

ADF4196

THERMAL RESISTANCE

θJA is specified for the worst-case conditions, that is, a device

soldered in a circuit board for surface-mount packages.

Table 4. Thermal Resistance

Package Type

θJA

32-Lead LFCSP (Paddle Soldered) 27.3

Unit

°C/W

TRANSISTOR COUNT

This device includes 75,800 metal oxide semiconductors (MOS)

and 545 bipolar junction transistors (BJT).

ESD CAUTION

Rev. D | Page 5 of 28

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