GL6ZS27 Ver la hoja de datos (PDF) - Sharp Electronics

Número de pieza

componentes Descripción

fabricante

GL6ZS27

DEVICE SPECIFICATION FOR Light Emitting Diode

Sharp Electronics 

r

DG996047

MODEL No.

GL6ZS27

Jun/16/99

PAGE

5110

4. Reliability

The reliability of productsshahbe satisfiedwith itemslistedbelow.

4-1.Test itemsandtestconditions

Test items

Test conditions

Solderability

Soldering

temperature

Mechanicalshock

Variable frequency

vibration

Terminalstrength

(Tension)

Terminal strength

(Bending)

230+5=C, 5s

Prior disposition: Dip in rosinflux

260+5”c, 5s

15OOOm/s02,.5ms.

3timesI iX,*Y,dZ direction

200m/s2,100to 2 000 to lOOHz/sweepfor 4min.

,4times/iX,iY,fz direction

Weight:lON, Ss/each terminal

Weight:SN, 0” + 90” ---fO”+ -90” + 0”

/each terminal

Temperaturecycling -40~(3Ot~1i1$~-+1~“c(3O111in),3c0ycles

W’ temP*md ‘@’ Ta=+(jf)“C, g()%w, t=lt)oh

humidity storage

High temperaturestorageTa=100”C,t=lOOOh

Low temperaturestorageTa=-4Ot, t=lOOOh

Operationlife

Ta=25”C, IFMAX, t=lOOOh*3

Confidencelevel: 90%

Samples(n) LTPD

Defective (C) (o/o)

n=ll, C=O 20

n=ll,C=O

20

n=ll. C=O 20

n=ll. C=O 20

n=ll, C=O 20

n=ll, C=O 20

n=22, C=O 10

n=22, C=O 10

n=22, C=O 10

n=22. C=O 10

n=22. C=O 10

4-2. MeasurementitemsandFailurejudgementcriteria *1

Measurement

Symbol

Failurejudgementcriteria *2

Forward voltage

VF

v, > U.S.L. x 1.2

Reversecurrent

IR

Ia > U.S.L. x 2.0

. Luminousintensity

Iv

Iv > The first stagevalueX 2.0 or The first stagevalueX 0.5 > Iv

z Solderability : Sol&r shallbeadhereat the areaof 95% or moreof dippedportion.

z Terminalstrength: Packageis not destroyed,andterminalis not slack.

* 1: Measuringcondition is in accordancewith specification.

*2: U.S.L. is shownby Upper SpecificationLimit.

*3: IF w.is shownby forward currentof absolutemaximumratings.

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