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STW12NK80Z Ver la hoja de datos (PDF) - STMicroelectronics

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STW12NK80Z Datasheet PDF : 22 Pages
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Electrical characteristics
STB12NK80Z, STF12NK80Z, STP12NK80Z, STW12NK80Z
Table 7. Source drain diode
Symbol
Parameter
Test conditions
ISD
ISDM(1)
VSD(2)
Source-drain current
Source-drain current (pulsed)
Forward on voltage
ISD=10.5A, VGS=0
trr
Qrr
IRRM
Reverse recovery time
Reverse recovery charge
Reverse recovery current
ISD=10.5A,
di/dt = 100A/µs,
VDD=100V, Tj=150°C
1. Pulse width limited by safe operating area.
2. Pulsed: pulse duration=300µs, duty cycle 1.5%
Min. Typ. Max. Unit
-
10.5 A
-
42 A
-
1.6 V
635
ns
- 5.9
µC
18.5
A
Table 8. Gate-source zener diode
Symbol
Parameter
BVGSO
Gate-Source breakdown
voltage
Test conditions
Igs=±1mA
(Open drain)
Min Typ. Max. Unit
30
-
-
V
The built-in back-to-back Zener diodes have specifically been designed to enhance not only
the device’s ESD capability, but also to make them safely absorb possible voltage transients
that may occasionally be applied from gate to source. In this respect the Zener voltage is
appropriate to achieve an efficient and cost-effective intervention to protect the device’s
integrity. These integrated Zener diodes thus avoid the usage of external components.
6/22
Doc ID 9567 Rev 7

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