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HB52RF1289E2-75B Ver la hoja de datos (PDF) - Elpida Memory, Inc

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HB52RF1289E2-75B Datasheet PDF : 16 Pages
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HB52RF1289E2-75B
DC Characteristics (Ta = 0 to 55°C, VCC = 3.3 V ± 0.3 V, VSS = 0 V)
HB52RF1289E2-75B
Parameter
Symbol Min
Max
Unit Test conditions Notes
Operating current
I CC1
Standby current in power ICC2P
down
3215
803
Burst length = 1 1, 2, 3
mA
tRC = min
mA
CKE = VIL, tCK = 12 6
ns
Standby current in power ICC2PS
down (input signal stable)
767
mA
CKE = VIL, tCK = 7
Standby current in non ICC2N
power down
Active standby current in ICC3P
power down
1415
839
mA
CKE, S = VIH,
4
tCK = 12 ns
mA
CKE = VIL, tCK = 12 1, 2, 6
ns
Active standby current in ICC3N
non power down
Burst operating current
I CC4
Refresh current
I CC5
Self refresh current
I CC6
Input leakage current
I LI
10
Output leakage current ILO
10
1775
3575
5195
803
10
10
mA
CKE, S = VIH,
tCK = 12 ns
1, 2, 4
tCK = min, BL = 4 1, 2, 5
mA
tRC = min
3
mA
mA
VIH VCC 0.2 V
8
VIL 0.2 V
µA
0 Vin VCC
µA
0 Vout VCC
DQ = disable
Output high voltage
VOH
2.4
V
IOH = 4 mA
Output low voltage
VOL
0.4
V
IOL = 4 mA
Notes: 1. ICC depends on output load condition when the device is selected. ICC (max) is specified at the
output open condition.
2. One bank operation.
3. Input signals are changed once per one clock.
4. Input signals are changed once per two clocks.
5. Input signals are changed once per four clocks.
6. After power down mode, CK operating current.
7. After power down mode, no CK operating current.
8. After self refresh mode set, self refresh current.
Data Sheet E0018H10
10

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