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PI49FCT804ATP Ver la hoja de datos (PDF) - Pericom Semiconductor

Número de pieza
componentes Descripción
Lista de partido
PI49FCT804ATP
Pericom-Semiconductor
Pericom Semiconductor Pericom-Semiconductor
PI49FCT804ATP Datasheet PDF : 6 Pages
1 2 3 4 5 6
PI49FCT804T
Buffer/Clock Driver 1122334455667788990011223344556677889900112233445566778899001122112233445566778899001122334455667788990011223344556677889900112211223344556677889900112233445566778899001122334455667788990011221122334455667788990011223344556677889900112233445566778899001122112233445566778899001122
Maximum Ratings
(Above which the useful life may be impaired. For user guidelines, not tested.)
Storage Temperature ........................................................ –65°C to +150°C
Ambient Temperature with Power Applied ........................... 0°C to+70°C
Supply Voltage to Ground Potential (Inputs & Vcc Only) .. –0.5Vto+7.0V
Supply Voltage to Ground Potential (Outputs & D/O Only) –0.5Vto+7.0V
DC Input Voltage .................................................................–0.5Vto+7.0V
DC Output Current .......................................................................... 120mA
Power Dissipation ...............................................................................0.5W
Note:
Stresses greater than those listed under MAXIMUM
RATINGS may cause permanent damage to the device.
This is a stress rating only and functional operation
of the device at these or any other conditions above
those indicated in the operational sections of this
specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may
affect reliability.
DC Electrical Characteristics (Over the Operating Range, TA = 0°C to +70°C, VCC = 5.0V ± 5%)
Parameters Description
Test Conditions(1)
Min.
VOH
Output HIGH Voltage VCC = Min., VIN = VIH or VIL
IOH = –24.0mA
2.4
VOL
Output LOW Current VCC = Min., VIN = VIH or VIL
IOL = 64mA
VIH
Input HIGH Voltage Guaranteed Logic HIGH Level
2.0
VIL
Input LOW Voltage Guaranteed Logic LOW Level
IIH
Input HIGH Current VCC= Max.
VIN = VCC
IIL
Input LOW Current VCC= Max.
VIN = GND
IOZH
High Impedance
IOZL
Output Current
VCC = Max.
VOUT = VCC
VOUT = GND
II
Input HIGH Current VCC = Max., VIN =VCC(Max.)
VIK
Clamp Diode Voltage VCC = Min., IIN = –18 mA
IOS
Short Circuit Current VCC = Max.(3), VOUT = GND
–60
VH
Input Hysteresis
VCC = 5V
Typ.(2)
3.3
0.3
–0.7
–120
200
Max.
0.55
0.8
1
–1
1
–1
20
–1.2
–225
Units
V
V
V
V
µA
µA
µA
µA
µA
V
mA
mV
Capacitance (TA = 25°C, f = 1 MHz)
Parameters(4)
Description
Test Conditions
Typ.
Max.
Units
CIN
Input Capacitance
VIN = 0V
6
10
pF
COUT
Output Capacitance
VOUT = 0V
8
12
pF
Notes:
1. For Max. or Min. conditions, use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at Vcc = 5.0V, +25°C ambient and maximum loading.
3. Not more than one output should be shorted at one time. Duration of the test should not exceed one second.
4. This parameter is determined by device characterization but is not production tested.
2
PS7005B 06/26/01

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