M29W010B55N6 Ver la hoja de datos (PDF) - STMicroelectronics

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M29W010B55N6

1 Mbit (128Kb x8, Uniform Block) Low Voltage Single Supply Flash Memory

STMicroelectronics 

M29W010B

Table 11. Read AC Characteristics

(TA = 0 to 70°C or –40 to 85°C)

Symbol

Alt

Parameter

Test Condition

45

tAVAV

tAVQV

tELQX (1)

tRC

Address Valid to Next Address Valid

E = VIL,

G = VIL

Min

45

tACC Address Valid to Output Valid

E = VIL,

G = VIL

Max

45

tLZ

Chip Enable Low to Output

Transition

G = VIL Min 0

tELQV

tGLQX (1)

tCE Chip Enable Low to Output Valid

tOLZ

Output Enable Low to Output

Transition

G = VIL Max 45

E = VIL Min 0

tGLQV

tOE Output Enable Low to Output Valid

tEHQZ (1)

tHZ Chip Enable High to Output Hi-Z

tGHQZ (1)

tDF Output Enable High to Output Hi-Z

tEHQX

tGHQX

tAXQX

Chip Enable, Output Enable or

tOH Address Transition to Output

Transition

Note: 1. Sampled only, not 100% tested.

E = VIL Max 25

G = VIL Max 15

E = VIL Max 15

Min 0

M29W010B

55 70

55 70

55 70

0

0

55 70

0

0

30 30

20 25

20 25

0

0

Unit

90

90 ns

90 ns

0

ns

90 ns

0

ns

35 ns

30 ns

30 ns

0

ns

Figure 8. Read Mode AC Waveforms

A0-A16

E

G

DQ0-DQ7

tAVQV

tAVAV

VALID

tELQV

tELQX

tGLQX

tGLQV

tAXQX

tEHQZ

tEHQX

tGHQX

tGHQZ

VALID

AI02926

12/19

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