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EVAL-ADF4193EB1(RevB) Ver la hoja de datos (PDF) - Analog Devices

Número de pieza
componentes Descripción
Lista de partido
EVAL-ADF4193EB1
(Rev.:RevB)
ADI
Analog Devices ADI
EVAL-ADF4193EB1 Datasheet PDF : 28 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
ADF4193
Parameter
SW1, SW2, and SW3
RON (SW1 and SW2)
RON SW3
NOISE CHARACTERISTICS
900 MHz Output3
1800 MHz Output4
Phase Noise Figure of Merit5
B Version1
65
75
–108
–102
–216
Unit
Ω typ
Ω typ
dBc/Hz typ
dBc/Hz typ
dBc/Hz typ
Test Conditions/Comments
@ 5 kHz offset and 26 MHz PFD frequency
@ 5 kHz offset and 13 MHz PFD frequency
@ VCO output with dither off
1 Operating temperature range is from –40°C to +85°C.
2 The prescaler value is chosen to ensure that the RF input is divided down to a frequency that is less than this value.
3 fREFIN = 26 MHz; fSTEP = 200 kHz; fRF = 900 MHz; loop BW = 40 kHz.
4 fREFIN = 13 MHz; fSTEP = 200 kHz; fRF = 1850 MHz; loop BW = 60 kHz.
5 Calculated from the phase noise measured at 5 kHz with a 60 kHz loop BW. Increased noise contribution from the differential amplifier if the loop BW is reduced.
TIMING CHARACTERISTICS
AVDD = DVDD = 3 V ± 10%, VP1, VP2 = 5 V ± 10%, VP3 = 5.35 V ± 5%, AGND = DGND = GND = 0 V, RSET = 2.4 kΩ, dBm referred to
50 Ω, TA = TMIN to TMAX, unless otherwise noted.
Table 2.
Parameter
t1
t2
t3
t4
t5
t6
t7
Limit (B Version)1
10
10
10
15
15
10
15
Unit
ns min
ns min
ns min
ns min
ns min
ns min
ns min
Test Conditions/Comments
LE setup time
DATA to CLOCK setup time
DATA to CLOCK hold time
CLOCK high duration
CLOCK low duration
CLOCK to LE setup time
LE pulse width
1 Operating temperature is from −40°C to +85°C.
CLK
DATA
LE
LE
DB23
(MSB)
t2
t3
DB22
t1
t4
t5
DB2
DB1
(CONTROL BIT C2)
DB0 (LSB)
(CONTROL BIT C1)
t7
t6
Figure 2. Timing Diagram
Rev. B | Page 4 of 28

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