GS71116AJ Ver la hoja de datos (PDF) - Unspecified

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GS71116AJ

64K x 16 1Mb Asynchronous SRAM

Unspecified 

AC Test Conditions

Parameter

Conditions

Input high level

VIH = 2.4 V

Input low level

VI L= 0.4 V

Input rise time

tr = 1V/ns

Input fall time

tf = 1 V/ns

Input reference level

1.4 V

Output reference level

1.4 V

Output load

Fig. 1& 2

Notes:

1. Include scope and jig capacitance.

2. Test conditions as specified with output loading as shown in Fig. 1

unless otherwise noted.

3. Output load 2 for tLZ, tHZ, tOLZ and tOHZ

GS71116ATP/J/U

Output Load 1

DQ

50Ω 30pF1

VT = 1.4 V

Output Load 2

3.3 V

DQ

589Ω

5pF1 434Ω

Rev: 1.04a 10/2002

6/15

© 2001, Giga Semiconductor, Inc.

Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.

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