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74F786

4-bit asynchronous bus arbiter

Philips Electronics 

Philips Semiconductors

4-bit asynchronous bus arbiter

Product specification

74F786

RECOMMENDED OPERATING CONDITIONS

SYMBOL

PARAMETER

UNIT

VCC

Supply voltage

VIN

High–level input voltage

VIL

Low–level input voltage

IIk

Input clamp current

IOH

High–level output current

IOL

Low–level output current

Tamb

Operating free air temperature range

MIN

4.5

2.0

Commercial range

0

Industrial range

–40

LIMITS

NOM

5.0

MAX

5.5

0.8

–18

–1

24

+70

+85

TA =

–40 to

+85°C

V

V

V

mA

mA

mA

°C

°C

DC ELECTRICAL CHARACTERISTICS

(Over recommended operating free-air temperature range unless otherwise noted.)

SYMBOL

PARAMETER

TEST

CONDITIONS1

LIMITS

UNIT

MIN TYP2 MAX

VOH

High–level output voltage

VOL

Low–level output voltage

VCC = MIN, VIL =

MAX,

VIH = MIN

VCC = MIN, VIL =

MAX,

IOH = MAX ±10%VCC 2.4

V

±5%VCC 2.7 3.3

V

IOL = MAX ±10%VCC

0.30 0.50 V

VIH = MIN

±5%VCC

0.30 0.50 V

VIK

Input clamp voltage

VCC = MIN, II = IIK

II

Input current at maximum input voltage

VCC = 0.0V, VI = 7.0V

-0.73 -1.2 V

100 µA

IIH

High–level input current

VCC = MAX, VI = 2.7V

20 µA

IIL

Low–level input current

A – D, EN VCC = MAX, VI = 0.5V

-0.6 mA

BRn

-1.8 mA

IOS

Short–circuit output current3

VCC = MAX

-60

-150 mA

ICC

Supply current (total)

VCC = MAX

55 80 mA

Notes to DC electrical characteristics

1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.

2. All typical values are at VCC = 5V, Tamb = 25°C.

3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold

techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting

of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any

sequence of parameter tests, IOS tests should be performed last.

February 14, 1991

6

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