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IDT70261SL Ver la hoja de datos (PDF) - Integrated Device Technology

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componentes Descripción
Lista de partido
IDT70261SL
IDT
Integrated Device Technology IDT
IDT70261SL Datasheet PDF : 19 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
IDT70261S/L
High-Speed 16K x 16 Dual-Port Static RAM with Interrupt
Industrial and Commercial Temperature Ranges
AC Electrical Characteristics Over the
Operating Temperature and Supply Voltage Range(4)
70261X15
Com'l Only
70261X20
Com'l & Ind
70261X25
Com'l & Ind
Symbol
Parameter
Min. Max. Min. Max. Min. Max. Unit
READ CYCLE
tRC
Read Cycle Time
15
____
20
____
25
____
ns
tAA
Address Access Time
tACE
Chip Enable Access Time(3)
tABE
Byte Enable Access Time(3)
____
15
____
20
____
25
ns
____
15
____
20
____
25
ns
____
15
____
20
____
25
ns
tAOE
Output Enable Access Time
____
10
____
12
____
13
ns
tOH
Output Hold from Address Change
tLZ
Output Low-Z Time(1,2)
tHZ
Output High-Z Time(1,2)
tPU
Chip Enable to Power Up Time (2)
tPD
Chip Disable to Power Down Time(2)
tSOP
Semaphore Flag Update Pulse (OE or SEM)
3
____
3
____
3
____
ns
3
____
3
____
3
____
ns
____
10
____
12
____
15
ns
0
____
0
____
0
____
ns
____
15
____
20
____
25
ns
10
____
10
____
12
____
ns
tSAA
Semaphore Address Access Time
____
15
____
20
____
25
ns
3039 tbl 12a
70261X35
Com'l Only
70261X55
Com'l Only
Symbol
Parameter
Min. Max. Min. Max. Unit
READ CYCLE
tRC
Read Cycle Time
35
____
55
____
ns
tAA
Address Access Time
tACE
Chip Enable Access Time(3)
tABE
Byte Enable Access Time(3)
____
35
____
55
ns
____
35
____
55
ns
____
35
____
55
ns
tAOE
Output Enable Access Time
____
20
____
30
ns
tOH
Output Hold from Address Change
tLZ
Output Low-Z Time(1,2)
tHZ
Output High-Z Time(1,2)
tPU
Chip Enable to Power Up Time (2)
tPD
Chip Disable to Power Down Time(2)
tSOP
Semaphore Flag Update Pulse (OE or SEM)
3
____
3
____
ns
3
____
3
____
ns
____
15
____
25
ns
0
____
0
____
ns
____
35
____
50
ns
15
____
15
____
ns
tSAA
Semaphore Address Access Time
____
35
____
55
ns
NOTES:
1. Transition is measured 0mV from Low or High-impedance voltage with Output Test Load (Figure 2).
2. This parameter is guaranteed by device characterization, but is not production tested.
3. To access RAM, CE = VIL and SEM = VIH. To access semaphore, CE = VIH and SEM = VIL.
4. 'X' in part numbers indicates power rating (S or L).
3039 tbl 12b
6.642

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