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P172 Ver la hoja de datos (PDF) - Agere -> LSI Corporation

Número de pieza
componentes Descripción
Lista de partido
P172
Agere
Agere -> LSI Corporation Agere
P172 Datasheet PDF : 8 Pages
1 2 3 4 5 6 7 8
Advance Data Sheet
August 2001
P172-Type Receiver
Qualification Information
The P172-type receiver is scheduled to complete the following qualification tests and meet the intent of Telcordia
Technologies GR-468-CORE.
Table 4. P172Type Qualification Information
Test
Mechanical Shock
and Vibration
Thermal Shock
Lead Integrity
Solderability
Low Temperature
Storage
High Temperature
Storage
Temperature
Cycling
Damp Heat
Cyclic Moisture
Resistance
ESD Threshold
Internal Moisture
Reference
Telcordia Technologies
GR-468-CORE,
Section 8.3.2
MIL-STD-883
Method 1011
MIL-STD-883
Method 2004
MIL-STD-883
Method 2003
Telcordia Technologies
GR-468-CORE,
Section 5.20
MIL-STD-883
Method 103
Telcordia Technologies
GR-468-CORE,
Section 5.23
Telcordia Technologies
GR-468-CORE,
Section 5.22
MIL-STD-883
Method 1018
Conditions
Sample Size
Pass/Fail Criteria
500 g, 0.5 ms
11
10% Responsivity
Condition A, 20 g,
Change After Completion
20 Hz to 2000 Hz,
of Both Tests
4 min./cycle,
4 cycles
0°C to 100 °C,
20 cycles
Condition A
11
To Be Provided by
the Supplier
Physical Attributes and
Leak Check
–40 °C storage
2000 hours
To Be Provided by
the Supplier
11
10% Responsivity
Change After Completion
of Test
85°C storage
2000 hours
11
10% Responsivity
Change After Completion
of Test
–40 °C to +85 °C,
11
10% Responsivity
500 cycles
Change After Completion
of Test
85 °C/85% RH
1000 hours
11
10% Responsivity
Change After Completion
of Test
11
10% Responsivity
Change After Completion
of Test
6
Telcordia Requirement
11 Pieces After Max 5000 ppm Water
Thermal Shock Vapor After Other Test
Test
Cells
Agere Systems Inc.
7

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