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PLDC20RA10 Ver la hoja de datos (PDF) - Cypress Semiconductor

Número de pieza
componentes Descripción
Lista de partido
PLDC20RA10
Cypress
Cypress Semiconductor Cypress
PLDC20RA10 Datasheet PDF : 14 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
PLDC20RA10
Maximum Ratings
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature ................................. 65°C to +150°C
Ambient Temperature with
Power Applied............................................. 55°C to +125°C
Supply Voltage to Ground Potential
(Pin 24 to Pin 12) ........................................... 0.5V to +7.0V
DC Voltage Applied to Outputs
in High Z State ............................................... 0.5V to +7.0V
DC Input Voltage......................................... 3.0 V to + 7.0 V
Output Current into Outputs (LOW) .............................16 mA
Static Discharge Voltage ........................................... >2001V
(per MIL-STD-883, Method 3015)
Latch-Up Current..................................................... >200 mA
DC Program Voltage .................................................... 13.0V
Operating Range
Range
Commercial
Military[2]
Ambient
Temperature
0°C to +75°C
55°C to +125°C
VCC
5V ± 10%
5V ± 10%
]
Electrical Characteristics Over the Operating Range[3]
Parameter
Description
Test Conditions
VOH
Output HIGH Voltage
VCC = Min.,
VIN =VIH or VIL
IOH = 3.2 mA
IOH = 2 mA
Coml
Mil
VOL
Output LOW Voltage
VIH
Input HIGH Level
VIL
Input LOW Level
VCC = Min.,
VIN = VIH or VIL
IOL = 8 mA
Guaranteed Input Logical HIGH Voltage for All Inputs[4]
Guaranteed Input Logical LOW Voltage for All Inputs[4]
IIX
Input Leakage Current
VSS VIN VCC, VCC = Max
IOZ
Output Leakage Current
VCC = Max., VSS VOUT VCC
ISC
Output Short Circuit Current[5] VCC = Max., VOUT = 0.5V[6]
ICC1
Standby Power Supply Current VCC= Max., VIN = GND Outputs Open
Coml
Mil
ICC2
Power Supply Current at
Frequency[5]
VCC = Max., Outputs Disabled (In High Z
State) Device Operating at fMAX
Coml
Mil
Min. Max. Unit
2.4
V
0.5 V
2.0
V
0.8 V
10 +10 µA
40 +40 µA
30 90 mA
75 mA
80 mA
80 mA
85 mA
Capacitance[5]
Parameter
Description
Test Conditions
Max.
Unit
CIN
Input Capacitance
VIN = 2.0 V @ f = 1 MHz
10
pF
COUT
Output Capacitance
VOUT = 2.0 V @ f = 1 MHz
10
pF
Notes:
2. TA is the instant oncase temperature.
3. See the last page of this specification for Group A subgroup testing information.
4. These are absolute values with respect to device ground and all overshoots due to system or tester noise are included.
5. Tested initially and after any design or process changes that may affect these parameters.
6. Not more than one output should be tested at a time. Duration of the short circuit should not be more than one second. VOUT = 0.5 V has been chosen to
avoid test problems caused by tester ground degradation.
Document #: 38-03012 Rev. **
Page 5 of 14

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